SCOPUS 정보 검색 플랫폼

Volumn 182, Issue 3-4, 1997, Pages 281-291

Influence of the surface morphology on the relaxation of low-strained InxGa1 - xAs linear buffer structures

(11) Valtuena J F a Sacedon A a Alvarez, A L a Izpura, I a Calle, F a Calleja, E a MacPherson, G b Goodhew, P J b Pacheco, F J c Garcia R c Molina, S I c

a UNIVERSIDAD POLITÉCNICA DE MADRID (Spain)

b UNIVERSITY OF LIVERPOOL (United Kingdom)

c UNIVERSITY OF CÁDIZ (Spain)

Author keywords

Buffer layers; Growth mode; InGaAs; Low strain; Relaxation mechanisms

Indexed keywords

CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); MORPHOLOGY; NUCLEATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; STRESS RELAXATION; SUBSTRATES; SURFACE ROUGHNESS;

BUFFER LAYERS; SURFACE ELASTIC STRAIN RELAXATION;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0031550005 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(97)00377-1 Document Type: Article

Times cited : (12)

References (36)

1
- 0026932472
- A.G. Cullis, D.J. Robbins, A.J. Pidduck, P.W. Smith, J. Crystal Growth 123 (1992) 333.
- (1992) J. Crystal Growth , vol.123 , pp. 333
- Cullis, A.G.¹ Robbins, D.J.² Pidduck, A.J.³ Smith, P.W.⁴

2
- 0037577761
- C.W. Snyder, B.G. Orr, D. Kessler, L.M. Sander, Phys. Rev. Lett. 66 (1991) 3032.
- (1991) Phys. Rev. Lett. , vol.66 , pp. 3032
- Snyder, C.W.¹ Orr, B.G.² Kessler, D.³ Sander, L.M.⁴

3
- 0039458125
- in press
- D.J. Dunstan, P. Kidd, R. Beanland, A. Sacedón, E. Calleja, L. González, Y. González, F.J. Pacheco, J. Mater. Sci. Technol. (1996), in press.
- (1996) J. Mater. Sci. Technol.
- Dunstan, D.J.¹ Kidd, P.² Beanland, R.³ Sacedón, A.⁴ Calleja, E.⁵ González, L.⁶ González, Y.⁷ Pacheco, F.J.⁸

4
- 21844497630
- G. Macpherson, P.J. Goodhew, R. Beanland, Phylos. Mag. A 72 (1995) 1531.
- (1995) Phylos. Mag. A , vol.72 , pp. 1531
- Macpherson, G.¹ Goodhew, P.J.² Beanland, R.³

5
- 0039458113
- N. Grandjean, J. Massies, J. Crystal Growth 134 (1993) 61.
- (1993) J. Crystal Growth , vol.134 , pp. 61
- Grandjean, N.¹ Massies, J.²

6
- 3343007423
- J. Tersoff, F.K. LeGoues, Phys. Rev. Lett. 72 (1994) 3570.
- (1994) Phys. Rev. Lett. , vol.72 , pp. 3570
- Tersoff, J.¹ LeGoues, F.K.²

7
- 3743118433
- F.K. Legoues, P.M. Mooney, J. Tersoff, Phys. Rev. Lett. 71 (1993) 396.
- (1993) Phys. Rev. Lett. , vol.71 , pp. 396
- Legoues, F.K.¹ Mooney, P.M.² Tersoff, J.³

8
- 0039458123
- E.T. Klaus, H. Poog, J. Crystal Growth 135 (1994) 97.
- (1994) J. Crystal Growth , vol.135 , pp. 97
- Klaus, E.T.¹ Poog, H.²

9
- 0026413298
- S. Guha, K.C. Rajkumar, A. Madhukar, J. Crystal Growth 111 (1994) 434.
- (1994) J. Crystal Growth , vol.111 , pp. 434
- Guha, S.¹ Rajkumar, K.C.² Madhukar, A.³

10
- 21544434863
- E.A. Fitzgerald, G.P. Watson, R.E. Proano, D.G. Ast, P.D. Kirchner, G.D. Pettit, J.M. Woodall, J. Appl. Phys. 65 (1989) 2220.
- (1989) J. Appl. Phys. , vol.65 , pp. 2220
- Fitzgerald, E.A.¹ Watson, G.P.² Proano, R.E.³ Ast, D.G.⁴ Kirchner, P.D.⁵ Pettit, G.D.⁶ Woodall, J.M.⁷

11
- 0030566425
- P. Kidd, D.J. Dunstan, H.G. Colson, M.A. Lourenço, A. Sacedón, F. González-Sanz, L. González, Y. Gonzalez, R. García, D. González, F.J. Pacheco, P. Goodhew, J. Crystal Growth 169 (1996) 649.
- (1996) J. Crystal Growth , vol.169 , pp. 649
- Kidd, P.¹ Dunstan, D.J.² Colson, H.G.³ Lourenço, M.A.⁴ Sacedón, A.⁵ González-Sanz, F.⁶ González, L.⁷ Gonzalez, Y.⁸ García, R.⁹ González, D.¹⁰ Pacheco, F.J.¹¹ Goodhew, P.¹²

12
- 0000344598
- V. Krishnamoorthy, P. Rivas, R.M. Park, Appl. Phys. Lett. 58 (1991) 2000.
- (1991) Appl. Phys. Lett. , vol.58 , pp. 2000
- Krishnamoorthy, V.¹ Rivas, P.² Park, R.M.³

13
- 0000377469
- K. Tillmann, D. Gerthsen, P. Pfundstein, A. Föster, K. Urban, J. Appl. Phys. 78 (1995) 3824.
- (1995) J. Appl. Phys. , vol.78 , pp. 3824
- Tillmann, K.¹ Gerthsen, D.² Pfundstein, P.³ Föster, A.⁴ Urban, K.⁵

14
- 36449006709
- J.W.P. Hsu, E.A. Fitzgerald, Y.H. Xie, P.J. Silverman, M.J. Cardillo, Appl. Phys. Lett. 61 (1992) 1293.
- (1992) Appl. Phys. Lett. , vol.61 , pp. 1293
- Hsu, J.W.P.¹ Fitzgerald, E.A.² Xie, Y.H.³ Silverman, P.J.⁴ Cardillo, M.J.⁵

15
- 5344236966
- D.J. Dunstan, P. Kidd, L. Howard, R.H. Dixon, Appl. Phys. Lett. 59 (1991) 3390.
- (1991) Appl. Phys. Lett. , vol.59 , pp. 3390
- Dunstan, D.J.¹ Kidd, P.² Howard, L.³ Dixon, R.H.⁴

16
- 5344236298
- D.J. Dunstan, P. Kidd, P.F. Fewster, N.L. Andrew, R. Grey, J.P.R. David, L. González, Y. González. A. Sacedón, F. González-Sanz, Appl. Phys. Lett. 65 (1994) 839.
- (1994) Appl. Phys. Lett. , vol.65 , pp. 839
- Dunstan, D.J.¹ Kidd, P.² Fewster, P.F.³ Andrew, N.L.⁴ Grey, R.⁵ David, J.P.R.⁶ González, L.⁷ González, Y.⁸ Sacedón, A.⁹ González-Sanz, F.¹⁰

17
- 12844255195
- submitted
- A. Sacedón, R. Beanland, H. Colson, E. Calleja, Appl. Phys. Lett., 1996, submitted.
- (1996) Appl. Phys. Lett.
- Sacedón, A.¹ Beanland, R.² Colson, H.³ Calleja, E.⁴

18
- 21544472035
- J. Tersoff, Appl. Phys. Lett. 62 (1993) 693.
- (1993) Appl. Phys. Lett. , vol.62 , pp. 693
- Tersoff, J.¹

19
- 36449005204
- A. Sacedón, F. González-Sanz, E. Calleja, E. Muñoz, S.I. Molina, F.J. Pacheco, D. Araujo, R. García, M. Lourenço, Z. Yang, P. Kidd, D. Dunstan, Appl. Phys. Lett. 66 (1995) 3334.
- (1995) Appl. Phys. Lett. , vol.66 , pp. 3334
- Sacedón, A.¹ González-Sanz, F.² Calleja, E.³ Muñoz, E.⁴ Molina, S.I.⁵ Pacheco, F.J.⁶ Araujo, D.⁷ García, R.⁸ Lourenço, M.⁹ Yang, Z.¹⁰ Kidd, P.¹¹ Dunstan, D.¹²

20
- 0040050067
- Substrate cleavage edges have been used for 〈1 1 0〉 direction discrimination
- Substrate cleavage edges have been used for 〈1 1 0〉 direction discrimination.

21
- 11944263290
- A.G. Cullis, A.J. Pidduck, M.T. Emeny, Phys. Rev. Lett. 12 (1995) 2368.
- (1995) Phys. Rev. Lett. , vol.12 , pp. 2368
- Cullis, A.G.¹ Pidduck, A.J.² Emeny, M.T.³

22
- 0001087638
- T.G. Andersson, Z.G. Chen, V.D. Kulakovskii, A. Uddin, T. Vallin, Appl. Phys. Lett. 51 (1987) 752.
- (1987) Appl. Phys. Lett. , vol.51 , pp. 752
- Andersson, T.G.¹ Chen, Z.G.² Kulakovskii, V.D.³ Uddin, A.⁴ Vallin, T.⁵

23
- 0006369789
- M. Grundmann, U. Lienert, J. Christen, D. Bimberg, A. Ficher-Colbrie, J.N. Miller, J. Vac. Sci. Technol. B 8 (1990) 751.
- (1990) J. Vac. Sci. Technol. B , vol.8 , pp. 751
- Grundmann, M.¹ Lienert, U.² Christen, J.³ Bimberg, D.⁴ Ficher-Colbrie, A.⁵ Miller, J.N.⁶

24
- 0039458114
- D.H. Rich, T. George, W.T. Pike, J. Maserjian, F.J. Grunthaner, A. Larsson, J. Appl. Phys. 72 (1992) 5834.
- (1992) J. Appl. Phys. , vol.72 , pp. 5834
- Rich, D.H.¹ George, T.² Pike, W.T.³ Maserjian, J.⁴ Grunthaner, F.J.⁵ Larsson, A.⁶

25
- 0040050066
- H. Gao, J. Mech. Phys. Solids 42 (5) (1994) 773.
- (1994) J. Mech. Phys. Solids , vol.42 , Issue.5 , pp. 773
- Gao, H.¹

26
- 0000861083
- W.H. Yang, D.J. Srolovitz, Phys. Rev. Lett. 71 (1993) 1593.
- (1993) Phys. Rev. Lett. , vol.71 , pp. 1593
- Yang, W.H.¹ Srolovitz, D.J.²

27
- 0040643457
- J. Grilhe, Acta Metallogr. (1993) 909.
- (1993) Acta Metallogr. , pp. 909
- Grilhe, J.¹

28
- 0024611337
- D.J. Srolovitz, Acta Metallogr. 37 (2) (1989) 621.
- (1989) Acta Metallogr. , vol.37 , Issue.2 , pp. 621
- Srolovitz, D.J.¹

29
- 0040050068
- note
- To estimate the critical wavelength of sample E, it is necessary to use EC 2, including the grading surface strain and the strain due to the composition step.

30
- 0346152016
- J. Tersoff, R.M. Tromp, Phys. Rev. Lett. 70 (1993) 2782.
- (1993) Phys. Rev. Lett. , vol.70 , pp. 2782
- Tersoff, J.¹ Tromp, R.M.²

31
- 36549096195
- K.L. Kavanagh, M.A. Capano, L.W. Hobbs, J.C. Barbour, P.M.J. Marée, W. Schaff, J.W. Mayer, D. Pettit, J.M. Woodallo, J.A. Stroscio, R.M. Feenstra, J. Appl. Phys. 64 (1988) 4843.
- (1988) J. Appl. Phys. , vol.64 , pp. 4843
- Kavanagh, K.L.¹ Capano, M.A.² Hobbs, L.W.³ Barbour, J.C.⁴ Marée, P.M.J.⁵ Schaff, W.⁶ Mayer, J.W.⁷ Pettit, D.⁸ Woodallo, J.M.⁹ Stroscio, J.A.¹⁰ Feenstra, R.M.¹¹

32
- 0029719852
- A.L. Alvarez, F. Calle, A. Sacedón, E. Calleja, E. Muñoz, R. García, L. González, P. Kidd, R. Beanland, P. Goodhew, Solid State Electron. 40 (1996) 647.
- (1996) Solid State Electron. , vol.40 , pp. 647
- Alvarez, A.L.¹ Calle, F.² Sacedón, A.³ Calleja, E.⁴ Muñoz, E.⁵ García, R.⁶ González, L.⁷ Kidd, P.⁸ Beanland, R.⁹ Goodhew, P.¹⁰

33
- 85177110372
- M. Alberech, S. Christiansen, J. Michler, W. Dorsch, H.P. Strunk, Appl. Phys. Lett. 67 (1995) 1232.
- (1995) Appl. Phys. Lett. , vol.67 , pp. 1232
- Alberech, M.¹ Christiansen, S.² Michler, J.³ Dorsch, W.⁴ Strunk, H.P.⁵

34
- 4243930986
- D.E. Jesson, S.J. Pennycook, J.M. Baribeau, D.C. Houghton, Phys. Rev. Lett. 11 (1993) 1774.
- (1993) Phys. Rev. Lett. , vol.11 , pp. 1774
- Jesson, D.E.¹ Pennycook, S.J.² Baribeau, J.M.³ Houghton, D.C.⁴

35
- 0002425060
- Y. Chen, X.W. Lin, Z. Lillental-Wber, J. Washburn, J.F. Klem, J.T. Tsao, Appl. Phys. Lett. 68 (1996) 111.
- (1996) Appl. Phys. Lett. , vol.68 , pp. 111
- Chen, Y.¹ Lin, X.W.² Lillental-Wber, Z.³ Washburn, J.⁴ Klem, J.F.⁵ Tsao, J.T.⁶

36
- 36549099314
- P.M. Marée, J.C. Barbour, J.F. van der Veen, K.L. Kavanagh, C.W.T. Bulle-Lieuwma, M.P.A. Viegers, J. Appl. Phys. 62 (1987) 4413.
- (1987) J. Appl. Phys. , vol.62 , pp. 4413
- Marée, P.M.¹ Barbour, J.C.² Van Der Veen, J.F.³ Kavanagh, K.L.⁴ Bulle-Lieuwma, C.W.T.⁵ Viegers, M.P.A.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.