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Volumn 44, Issue 4 A, 2005, Pages 1928-1931

Crystallization and structural phase transformation in sub-100-nm-thick SrBi2Ta2O9 thin film

Author keywords

Aurivillius structure; Crystallization; Ferroelectric thin films; Fluorite structure; Grain growth; SrBi2Ta2O9 (SBT); Structural transformation

Indexed keywords

CRYSTALLIZATION; FERROELECTRIC THIN FILMS; FIELD EFFECT TRANSISTORS; GRAIN GROWTH; PHASE TRANSITIONS; SOL-GELS; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 21244462755     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.1928     Document Type: Article
Times cited : (6)

References (28)
  • 24
    • 4344680109 scopus 로고    scopus 로고
    • eds. O. Auciello and A. R. Krauss (John Wiley & Sons, Canada) Chap. 6
    • E. Chason: In Situ Real-Time Characterization of Thin Films, eds. O. Auciello and A. R. Krauss (John Wiley & Sons, Canada, 2001) Chap. 6, p. 167.
    • (2001) In Situ Real-time Characterization of Thin Films , pp. 167
    • Chason, E.1
  • 25
    • 0003314824 scopus 로고    scopus 로고
    • High-resolution X-ray scattering from thin films and multilayers
    • (Springer-Verlag, Berlin) Chap. 10
    • V. Holy, U. Pietsch and T. Baumbach: High-Resolution X-ray Scattering from Thin Films and Multilayers (Springer-Verlag, Berlin, 2001) Springer Tracts in Modern Physics Vol. 149, Chap. 10, p. 191.
    • (2001) Springer Tracts in Modern Physics , vol.149 , pp. 191
    • Holy, V.1    Pietsch, U.2    Baumbach, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.