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Volumn 39, Issue 9 A, 2000, Pages 5247-5251
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In situ observation of the crystallization process of ferroelectric thin films by Raman microspectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTALLIZATION;
FERROELECTRICITY;
LEAD COMPOUNDS;
MAGNETRON SPUTTERING;
NUCLEATION;
PEROVSKITE;
RAMAN SPECTROSCOPY;
STOICHIOMETRY;
STRONTIUM COMPOUNDS;
THIN FILMS;
X RAY CRYSTALLOGRAPHY;
FERROELECTRIC THIN FILMS;
METALLORGANIC DECOMPOSITION;
DIELECTRIC FILMS;
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EID: 0034264780
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.39.5247 Document Type: Article |
Times cited : (15)
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References (28)
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