메뉴 건너뛰기




Volumn 39, Issue 9 A, 2000, Pages 5247-5251

In situ observation of the crystallization process of ferroelectric thin films by Raman microspectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; FERROELECTRICITY; LEAD COMPOUNDS; MAGNETRON SPUTTERING; NUCLEATION; PEROVSKITE; RAMAN SPECTROSCOPY; STOICHIOMETRY; STRONTIUM COMPOUNDS; THIN FILMS; X RAY CRYSTALLOGRAPHY;

EID: 0034264780     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5247     Document Type: Article
Times cited : (15)

References (28)
  • 12
    • 33645044581 scopus 로고    scopus 로고
    • Private communication from JASCO
    • Private communication from JASCO.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.