Method of distinguishing SrBi2Ta2O9 phase from fluorite phase using X-ray diffraction reciprocal space mapping

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 9 B, 2000, Pages 5489-5495

  Saito, Keisuke ^a   Mitsuya, Masatoshi ^b   Nukaga, Norimasa ^b   Yamaji, Isao ^a   Akai, Takao ^a   Funakubo, Hiroshi ^b  

^a Philips Analyt Applic Lab Japan   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; CRYSTAL GROWTH; CRYSTALLOGRAPHY; FERROELECTRIC THIN FILMS; FILM PREPARATION; FLUORINE COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PEROVSKITE; PHASE COMPOSITION; PLATINUM; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC PHASES; FLUORITE PHASE; PHASE IDENTIFICATION; PYROCHLORE PHASES; RECIPROCAL SPACE MAPPING; STRONTIUM BISMUTH TANTALATE;

STRONTIUM COMPOUNDS;

EID: 0034262566     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5489     Document Type: Article

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