Raman spectroscopic fingerprint of ferroelectric SrBi2Ta2O9 thin films: A rapid distinction method for fluorite and pyrochlore phases

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 40, Issue 8 B, 2001, Pages

  Osada, Minoru ^a   Kakihana, Masato ^a   Mitsuya, Masatoshi ^a   Watanabe, Takayuki ^a   Funakubo, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Fluorite; Impurity phase; Phase identification; Pyrochlore; Raman scattering; SrBi2(Ta1 xNbx)2O 9 (SBTN)

Indexed keywords

CRYSTALLOGRAPHY; ELECTROMAGNETIC WAVE BACKSCATTERING; FILM GROWTH; PEROVSKITE; RAMAN SPECTROSCOPY; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

RAMAN SPECTROSCOPIC FINGERPRINTS;

FERROELECTRIC THIN FILMS;

EID: 0035880365     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.l891     Document Type: Article

References (16)