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Applied Surface Science

Volumn 249, Issue 1-4, 2005, Pages 419-424

Growth of SrTiO 3 films on Si(0 0 1)-Sr(2 × 1) surfaces

(4) Bhuiyan, Md Nurul Kabir a Kimura, Hiroaki a Tambo, Toyokazu a Tatsuyama, Chiei a

a UNIVERSITY OF TOYAMA (Japan)

Author keywords

AFM; MBD; RHEED; Si(0 0 1) substrates; SrTiO 3 films; XRD

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; ELECTRON DIFFRACTION; LATTICE CONSTANTS; MOLECULAR BEAMS; OXYGEN; SILICON; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

CAPACITOR DIELECTRIC; MOLECULAR BEAM DEPOSITION; ROOM TEMPERATURE; SRTIO3 FILMS;

STRONTIUM COMPOUNDS;

EID: 21244454030 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2004.12.035 Document Type: Article

Times cited : (10)

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