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Volumn 82, Issue 23, 2003, Pages 4125-4127

45° rotational epitaxy of SrTiO3 thin films on sulfide-buffered Si

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; EPITAXIAL GROWTH; INTERFACES (MATERIALS); STACKING FAULTS; STRONTIUM COMPOUNDS; SULFUR COMPOUNDS;

EID: 0037491251     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1581383     Document Type: Article
Times cited : (15)

References (12)
  • 9
    • 0037906645 scopus 로고    scopus 로고
    • note
    • f are atomic distance of the ZnS (100) film and STO (110), respectively. In this case, I = 3 and I' = 4 along the c axis of STO.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.