Radiation-induced effects on the XAA1.2 ASIC chip for space application

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 538, Issue 1-3, 2005, Pages 465-482

  Del Monte, Ettore ^a,b   Pacciani, Luigi ^a   Porrovecchio, Geiland ^a   Soffitta, Paolo ^a   Costa, Enrico ^a   Di Persio, Giuseppe ^a   Feroci, Marco ^a   Mastropietro, Marcello ^a   Morelli, Ennio ^a   Rapisarda, Massimo ^c   Rubini, Alda ^a   Bisello, Dario ^d   Candelori, Andrea ^d   Kaminski, Alexandre ^d   Wyss, Jeffery ^e  

^a CNR   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

^c ENEA   (Italy)

^d UNIVERSITY OF PADOVA   (Italy)

^e UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

ASIC; High Energy Astrophysics; Radiation damage; X rays

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ASTROPHYSICS; CMOS INTEGRATED CIRCUITS; COSMIC RAYS; DOSIMETRY; EPITAXIAL GROWTH; ORBITS; RADIATION HARDENING; SPACE APPLICATIONS; X RAYS;

COSMIC RAYS ENVIRONMENT; HIGH-ENERGY; LOW-EARTH ORBIT; RADIATION HARD DEVICE;

MICROPROCESSOR CHIPS;

EID: 20144371185     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.08.110     Document Type: Article

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