Experimental studies of single-event effects induced by heavy ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 164, Issue , 2000, Pages 973-978

  Liu, J ^a   Hou, M D ^a   Li, B Q ^a   Liu, C L ^a   Wang, Z G ^a   Cheng, S ^a   Sun, Y M ^a   Jin, Y F ^a   Lin, Y L ^b   Cai, J R ^b   Wang, S J ^b   Ye, Z H ^b   Zhu, G W ^b   Du, H ^b   Ren, Q Y ^b   Wu, W ^b   Mao, X M ^b   Sun, Y Q ^b   Guo, R ^b  

^a INSTITUTE OF MODERN PHYSICS   (China)

^b CENTER FOR SPACE SCIENCE AND APPLIED RESEARCH   (China)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS; MICROELECTRONICS; RANDOM ACCESS STORAGE;

SINGLE-EVENT EFFECTS (SEE);

RADIATION EFFECTS;

EID: 0033733569     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)01103-9     Document Type: Article

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