Measurement of SEU cross sections in the CDF SVX3 ASIC using 63 MeV protons

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 447, Issue 1, 2000, Pages 160-166

  Grim, G P ^a   Bishai, M ^b   Gay, C ^c   Hill, C ^a   Nahn, S ^c   Pellett, D E ^a   Pope, G ^d   Shepard, P F ^d   Slaughter, A J ^c   Wester III, W C ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

^c YALE UNIVERSITY   (United States)

^d UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; GATES (TRANSISTOR); PARTICLE BEAM TRACKING; PROTON IRRADIATION; READOUT SYSTEMS; SILICON SENSORS;

SILICON STRIP DETECTORS (SSD); SILICON TRACKERS; SILICON VERTEX DETECTORS (SVD); SINGLE EVENT UPSET (SEU);

PARTICLE DETECTORS;

EID: 0033707253     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00184-4     Document Type: Article

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