Effects of grazing incidence conditions on the x-ray diffuse scattering from self-assembled nanoscale islands

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 11, 2005, Pages

  Schmidbauer, M ^a   Grigoriev, D ^a   Hanke, M ^a,b   Schafer P ^a   Wiebach, T ^a   Kohler R ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM DERIVATIVE; SILICON DERIVATIVE;

ARTICLE; CHEMICAL COMPOSITION; FINITE ELEMENT ANALYSIS; INCIDENCE; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; RADIATION SCATTERING; SEMICONDUCTOR; SIMULATION; THEORETICAL STUDY; X RAY DIFFRACTION;

EID: 20044375631     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.115324     Document Type: Article

References (30)

1. D. Bimberg, M. Grundmann, and N. N. Ledentsov, Quantum Dot Heterostructures (Wiley, Chichester, NY, 1999).
2. V. Shchukin, N. N. Ledentsov, and D. Bimberg, Epitaxy of Nanostructures, Nanoscience and Technology (Springer, Berlin, 2003).
3. I. Stranski and L. Krastanow, Sitzungsber. Akad. Wiss. Wien, Math.-Naturwiss. Kl., Abt. 2B 146, 797 (1937).
4. M. Schmidbauer, X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures, Springer Tracts in Modern Physics Vol. 199 (Springer, Berlin, 2004).
5. J. R. Levine, J. B. Cohen, Y. W. Chung, and P. Georgopoulos, J. Appl. Crystallogr. 22, 528 (1989).
6. M. Schmidbauer, T. Wiebach, H. Raidt, M. Hanke, R. Köhler, and H. Wawra, Phys. Rev. B 58, 10 523 (1998).
7. V. Holý, A. A. Darhuber, J. Stangl, S. Zerlauth, F. Schäffler, G. Bauer, N. Darowski, D. Lübbert, U. Pietsch, and I. Vávra, Phys. Rev. B 58, 7934 (1998).
8. I. Kegel, T. H. Metzger, J. Peisl, P. Schittenhelm, and G. Abstreiter, Appl. Phys. Lett. 74, 2978 (1999).
9. I. Kegel, T. H. Metzger, A. Lorke, J. Peisl, J. Stangl, G. Bauer, J. M. Garcia, and P. M. Petroff, Phys. Rev. Lett. 85, 1694 (2000).
10. M. Rauscher, R. Paniago, H. Metzger, Z. Kovats, J. Domke, J. Peisl, H.-D. Pfannes, J. Schulze, and I. Eisele, J. Appl. Phys. 86, 6763 (1999).
11. I. Kegel, T. H. Metzger, A. Lorke, J. Peisl, J. Stangl, G. Bauer, K. Nordlund, W. V. Schoenfeld, and P. M. Petroff, Phys. Rev. B 63, 035318 (2001).
12. Z. Zhong, O. Ambacher, A. Link, V. Holý, J. Stangl, R. T. Lechner, T. Roch, and G. Bauer, Appl. Phys. Lett. 80, 3521 (2002).
13. V. M. Kaganer, S. A. Stepanov, and R. Köhler, Phys. Rev. B 52, 16 369 (1995).
14. D. Grigoriev, M. Hanke, M. Schmidbauer, P. Schäfer, O. Konovalov, and R. Köhler, J. Phys. D 36, A225 (2003).
15. U. Pietsch, V. Holý, and T. Baumbach, High Resolution X-Ray Scattering from Thin Films and Multilayers, Advanced Texts in Physics (Springer, Berlin, 2004).
16. T. Jach, P. L. Cowan, S. Qun, and M. J. Bedzyk, Phys. Rev. B 39, 5739 (1989).
17. A. M. Afanasyev and M. K. Melkoyan, Acta Crystallogr., Sect. A: Found. Crystallogr. 39, 207 (1983).
18. S. A. Stepanov and R. Köhler, J. Appl. Phys. 76, 7809 (1994).
19. S. Christiansen, M. Albrecht, H. P. Strunk, and H. J. Maier, Appl. Phys. Lett. 64, 3617 (1994).
20. T. Wiebach, M. Schmidbauer, M. Hanke, H. Raidt, R. Köhler, and H. Wawra, Phys. Rev. B 61, 5571 (2000).
21. T. Benabbas, P. Francios, Y. Androussi, and A. Lefebvre, J. Appl. Phys. 80, 2763 (1996).
22. M. Grundmann, O. Stier, and D. Bimberg, Phys. Rev. B 52, 11 969 (1995).
23. M. Hanke, M. Schmidbauer, D. Grigoriev, H. Raidt, P. Schäfer, R. Köhler, A.-K. Gerlitzke, and H. Wawra, Phys. Rev. B 69, 075317 (2004).
24. I. Kegel, T. H. Metzger, P. Fratzl, J. Peisl, A. Lorke, J. M. Garcia, and P. M. Petroff, Europhys. Lett. 45, 222 (1999).
25. E. Bauser, Crystal Growth of Electronic Materials (Elsevier, New York, 1985), p. 41.
26. M. Hanke, M. Schmidbauer, R. Köhler, F. Syrowatka, A. K. Gerlitzke, and T. Boeck, Appl. Phys. Lett. 84, 5228 (2004).
27. W. Dorsch, H. P. Strunk, H. Wawra, G. Wagner, J. Groenen, and R. Carles, Appl. Phys. Lett. 72, 179 (1998).
28. M. Hanke, H. Raidt, R. Köhler, and H. Wawra, Appl. Phys. Lett. 83, 4927 (2003).
29. M. Meixner, E. Schöll, M. Schmidbauer, H. Raidt, and R. Köhler, Phys. Rev. B 64, 245307 (2001).
30. M. Schmidbauer, M. Hanke, and R. Köhler, Phys. Rev. B 71, 115323 (2005).