Grazing incidence x-ray diffraction at free-standing nanoscale islands: Fine structure of diffuse scattering

Journal of Physics D: Applied Physics

Volumn 36, Issue 10 A, 2003, Pages

  Grigoriev, D ^a   Hanke, M ^a   Schmidbauer, M ^a   Schafer P ^a   Konovalov, O ^b   Kohler R ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; CRYSTAL STRUCTURE; ELASTICITY; FINITE ELEMENT METHOD; LATTICE CONSTANTS; LIQUID PHASE EPITAXY; MORPHOLOGY; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SUBSTRATES;

DIFFUSE SCATTERING; DISTORTED WAVE BORN APPROXIMATION; ELASTICITY THEORY; GRAZING INCIDENCE X RAY DIFFRACTION; NANOSCALE ISLANDS;

X RAY CRYSTALLOGRAPHY;

EID: 0037945606     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/10A/347     Document Type: Article

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