Polymer electrolyte gating of carbon nanotube network transistors

Nano Letters

Volumn 5, Issue 5, 2005, Pages 905-911

  Ozel, Taner ^a   Gaur, Anshu ^a   Rogers, John A ^a,b   Shim, Moonsub ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-PERFORMANCE MATERIALS; NETWORK TRANSISTORS; POLYMER ELECTROLYTES; SINGLE-WALLED CARBON NANOTUBES (SWNT);

CHEMICAL VAPOR DEPOSITION; ELECTRIC FREQUENCY MEASUREMENT; ELECTRIC POTENTIAL; ELECTROLYTES; FIELD EFFECT TRANSISTORS; HYSTERESIS; POLYETHYLENE OXIDES; POLYMERS;

CARBON NANOTUBES;

CARBON NANOTUBE; ELECTROLYTE; MACROGOL DERIVATIVE; POLYMER;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; SEMICONDUCTOR; ULTRASTRUCTURE;

ELECTROCHEMISTRY; ELECTROLYTES; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; NANOTECHNOLOGY; NANOTUBES, CARBON; POLYETHYLENE GLYCOLS; POLYMERS; TRANSISTORS;

EID: 19944416557     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0503781     Document Type: Article

References (33)

1. Avouris, Ph.; Appenzeller, J.; Martel, R.; Wind, S. J. Proc. IEEE 2003, 91, 1772.
2. Saito, R.; Dresselhaus, G.; Dresselhaus, M. S. Physical Properties of Carbon Nanotubes; Imperial College Press: London, 1998.
3. Dresselhaus, M. S.; Dresselhaus, G.; Saito R. Phys. Rev. B 1992, 45, 6234.
4. Mintmire, J. W.; Dunlap, B. I.; White C. T. Phys. Rev. Lett. 1992, 68, 631.
5. Dekker, C. Phys. Today 1999, 52, 22.
6. McEuen, P. L.; Fuhrer, M. S.; Park, H. K. IEEE Trans. Nanotechnol. 2002, 1, 78.
7. Tans, S. J.; Verschueren, A. R. M.; Dekker, C. Nature 1998, 393, 49.
8. Martel, R.; Schmidt, T.; Shea, H. R.; Hertel, T.; Avouris Ph. Appl. Phys. Lett. 1998, 73, 2447.
9. Derycke, V.; Martel, R.; Appenzeller, J.; Avouris, Ph. Nano Lett. 2001, 1, 453.
10. Bachtold, A.; Hadley, P.; Nakanishi, T.; Dekker, C. Science 2001, 294, 1317.
11. Kong, J.; Franklin, N. R.; Zhou, C.; Chapline, M. G.; Peng, S.; Cho, K.; Dai, H. Science 2000, 287, 622.
12. Htoon, H.; O'Connell, M. J.; Cox, P. J.; Doom, S. K.; Klimov, V. I. Phys. Rev. Lett. 2004, 93, 027401.
13. Hartschuh, A.; Pedrosa, H. N.; Novotny, L.; Krauss, T. D. Science 2003, 301, 1354.
14. Arnold, M. S.; Sharping, J. E.; Stupp, S. I.; Kumar, P.; Hersam, M. C. Nano Lett. 2003, 3, 1549.
15. Balasubramanian, K.; Sordan, R.; Burghard, M.; Kern, K. Nano Lett. 2004, 4, 827.
16. An, L.; Fu, Q.; Lu, C.; Liu, J. J. Am. Chem. Soc. 2004, 126, 10520.
17. Shim, M.; Javey, A.; Kam, N. W. S.; Dai, H. J. Am. Chem. Soc. 2001, 123, 11512.
18. Snow, E. S.; Novak, J. P.; Campbell, P. M.; Park, D. Appl. Phys. Lett. 2003, 52, 2145.
19. Zhou, Y. X.; Gaur, A.; Hur, S. H.; Kocabas, C.; Meitl, M. A.; Shim, M.; Rogers, J. A. Nano Lett. 2004, 4, 2031.
20. Javey, A.; Kim, H.; Brink, M.; Wang, Q.; Ural, A.; Guo, J.; McIntyre, P.; McEuen, P. L.; Lundstrom, M.; Dai, H. Nature Materials 2002, 1, 241.
21. Javey, A.; Guo, J.; Wang, Q.; Lundstrom, M.; Dai, H. Nature 2003, 424, 654.
22. Yaish, Y.; Park, J. Y.; Rosenblatt, S.; Sazonova, V.; Brink, M.; McEuen, P. L. Phys. Rev. Lett. 2003, 92, 046401.
23. Siddons, G. P.; Merchin, D.; Back, J. H.; Jeong, J. K.; Shim, M. Nano Lett. 2004, 4, 927.
24. Lu, C. G.; Fu, Q.; Huang, S. M.; Liu, J. Nano Lett. 2004, 4, 623.
25. Shim, M.; Siddons, G. P. Appl. Phys. Lett. 2003, 83, 3564.
26. Metal electrodes for 0.5 μm and 1 μm long channels were patterned with 6% poly(methyl methacrylate) in anisole using deep UV light source. The rest of the lithography steps were same as long channel devices using Shipley 1805 resist.
27. Bachilo, S. M.; Strano, M. S.; Kittrell, C.; Hauge, R. H.; Smalley, R. E.; Weisman, R. B. Science 2002, 298, 2361.
28. Rosenblatt, S.; Yaish, Y.; Park, J.; Gore, J.; Sazanova, V.; McEuen, P. L. Nano Lett. 2002, 2, 869.
29. Durkop, T.; Getty, S. A.; Cobas, E.; Fuhrer, M. S. Nano Lett. 2004, 4, 35-39.
30. Gray, F. M. Solid Polymer Electrolytes; VCH Publishers: New York, 1991.
31. device/0.015.
32. Fuhrer, M. S.; Nygard, J.; Shih, L.; Forero, M.; Yoon, Y. G.; Mazzoni, M. S. C.; Choi, H. J.; Ihm, J.; Louie, S. G.; Zettl, A.; McEuen, P. L. Science 2000, 288, 494.
33. Leonard, F.; Tersoff, J. Phys. Rev. Lett. 1999, 83, 5174.