Defect and fault tolerance of reconfigurable molecular computing

Proceedings - 12th Annual IEEE Symposium on Field-Programmable Custom Computing Machines, FCCM 2004

Volumn , Issue , 2004, Pages 176-185

  Tahoori, Mehdi B ^a   Mitra, Subhasish ^b  

^a NORTHEASTERN UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MANUFACTURING DEFECTS; MOLECULAR COMPUTING; MOLECULAR ELECTRONICS; PROGRAMMABLE LOGIC ARRAYS (PLA);

CMOS INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; COMPUTER HARDWARE; FIELD PROGRAMMABLE GATE ARRAYS; MOLECULAR GRAPHICS; SYSTEMS ANALYSIS; TABLE LOOKUP; VLSI CIRCUITS;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 18644373358     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FCCM.2004.26     Document Type: Conference Paper

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