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Volumn 78, Issue 2-4, 2005, Pages 569-575

X-ray diffraction studies of GaAs implanted with 1.5 MeV Se+ ions

Author keywords

GaAs; Ion implantation; X ray diffraction

Indexed keywords

AMORPHIZATION; CONCENTRATION (PROCESS); HEAVY IONS; ION IMPLANTATION; NUMERICAL ANALYSIS; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

EID: 18444408391     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2005.01.088     Document Type: Conference Paper
Times cited : (8)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.