Test programming environment in a modular, open architecture test system

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 413-422

  Pramanick, Ankan ^a   Krishnaswamy, Ramachandran ^a   Elston, Mark ^a   Adachi, Toshiaki ^a   Singh, Harsanjeet ^a   Parnas, Bruce ^a   Chen, Leon ^b  

^a Advantest America R and D Center   (United States)

^b CPU Tech   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING; COMPUTER PROGRAMMING LANGUAGES; COSTS; DATA ACQUISITION; GRAPHICAL USER INTERFACES; INTERFACES (COMPUTER); OPTIMIZATION;

OPEN ARCHITECTURE (OA) TEST SYSTEM; SEMICONDUCTOR TEST CONSORTIUM (STC); TEST CLASS PROGRAMMING; TEST PROGRAMS;

COMPUTER TESTING;

EID: 18144413607     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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