Scalable architecture for VLSI test

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 500-506

  Chang, Ed ^a   Cheung, David ^a   Huston, Robert ^a   Seaton, Jim ^a   Smith, Gary ^a  

^a Credence Systems Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; VLSI CIRCUITS;

EMBEDDED CORE COMPONENTS;

INTEGRATED CIRCUIT TESTING;

EID: 0032313708     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)