Mission impossible? Open architecture ATE

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 1207-

  Conti, Dennis R ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT; OPEN ARCHITECTURE SYSTEM; TEST INDUSTRY;

AUTOMATIC TESTING; DESIGN FOR TESTABILITY; OPEN SYSTEMS; STANDARDS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0036443232     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2002.1041912     Document Type: Conference Paper

References (0)