The consequences of an open ATE architecture

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 1210-

  Perez, Sergio M ^a  

^a Advantest America Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT; OPEN ARCHITECTURE;

AUTOMATIC TESTING; DESIGN FOR TESTABILITY; ELECTRONICS INDUSTRY; MARKETING; OPEN SYSTEMS; PRODUCT DEVELOPMENT; PRODUCTION ENGINEERING;

ELECTRONIC EQUIPMENT TESTING;

EID: 0036446215     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2002.1041915     Document Type: Article

References (0)