Open ATE architecture: Key challenges

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 1212-

  West, Burnell G ^a  

^a NPTest   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA VOLUME CONTROL; DATA VOLUME SUPPORT; INSTRUMENTATION DEFINITION; OPEN ARCHITECTURE; PACKAGE DIMENSIONS;

COMPUTER OPERATING SYSTEMS; COMPUTER SOFTWARE; COST EFFECTIVENESS; DATA HANDLING; ELECTRONICS PACKAGING; INTERCONNECTION NETWORKS; SYNCHRONIZATION;

SEMICONDUCTOR DEVICE TESTING;

EID: 0036444555     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2002.1041917     Document Type: Conference Paper

References (2)

1. West, Burnell G, Parameters for Open Architecture Low-Cost Test Systems, European Test Workshop Proceedings (2002)
2. Strauss, Steve; "The Need for a Revolution in Test Tooling", Southwest Test Workshop Archives (2000)