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Volumn , Issue , 1999, Pages 113-122
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Applications of semiconductor test economics, and multisite testing to lower cost of test
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATIC TESTING;
CALCULATIONS;
COST BENEFIT ANALYSIS;
COST EFFECTIVENESS;
RELIABILITY;
SEMICONDUCTOR DEVICE MODELS;
THROUGHPUT;
YIELD STRESS;
AUTOMATIC TEST EQUIPMENT;
COST PER UNIT;
MARGINAL RATE OF TECHNICAL SUBSTITUTION;
SEMICONDUCTOR TEST ECONOMICS;
SEMICONDUCTOR DEVICE TESTING;
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EID: 0033353560
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (30)
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References (16)
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