XML and Java for Open ATE Programming Environment

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 793-801

  Sivaram, A T ^a   Fan, Daniel ^a   Pryce, Jon ^a  

^a NPTest   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; DESIGN FOR TESTABILITY; JAVA PROGRAMMING LANGUAGE; XML;

SOFTWARE ARCHITECTURE;

BUILT-IN SELF TEST;

EID: 0142215965     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. S.Concina & Neil Richardson, Workstation Driven E-Beam Prober, ITC 1987
2. Art Downey, Industry graphics standards & ATE windowing software, ITC 1991
3. Don Organ, enVision: the inside story, ITC 1990
4. http://www.w3.org/XML/ World Wide Web Consortium (W3C)
5. "IEEE Standard Test Interface Language (STIL): 1450-1999"
6. http://www.onlineessays.com/essays/tech/tech13.php