Spectroscopic characterization of GaP surfaces treated in aqueous HCl solution

Journal of the Electrochemical Society

Volumn 152, Issue 3, 2005, Pages

  Tomioka, Katsuhiro ^a   Adachi, Sadao ^a  

^a GUNMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; ELLIPSOMETRY; HYDROCHLORIC ACID; INTERFACES (MATERIALS); PHOTOLUMINESCENCE; SPECTROSCOPIC ANALYSIS; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

DEAD-LAYER MODEL; HYDROGEN IRRADIATION; INTERFACE STATES; SPECTROSCOPIC CHARACTERIZATION;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 15744393384     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1854614     Document Type: Article

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