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Volumn 183, Issue 1-2, 2001, Pages 126-136

An X-ray photoelectron spectroscopy study of the oxides of GaAs

Author keywords

GaAs oxides; XPS

Indexed keywords

BINDING ENERGY; ELECTRON ENERGY LEVELS; OXIDATION; SURFACE STRUCTURE; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0035851282     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00583-9     Document Type: Article
Times cited : (185)

References (40)
  • 1
    • 0002758255 scopus 로고    scopus 로고
  • 28
    • 0002841648 scopus 로고
    • Ph.D. Thesis, Aston University
    • (1995)
    • Wei, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.