Single crystallites in "planar polycrystalline" oligothiophene films: Determination of orientation and thickness by polarization microscopy

Journal of Applied Physics

Volumn 83, Issue 7, 1998, Pages 3816-3824

  Vrijmoeth, J ^a   Stok, R W ^a   Veldman, R ^a   Schoonveld, W A ^a   Klapwijk, T M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; BIREFRINGENCE; CALCULATIONS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; MAXWELL EQUATIONS; MICROSCOPES; OPTICAL MICROSCOPY; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX; THIN FILMS;

BIAXIAL ANISOTROPY; OLIGOTHIOPHENE; POLARIZATION MICROSCOPY;

SINGLE CRYSTALS;

EID: 0032050271     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367145     Document Type: Article

References (29)

1. G. Horowitz, D. Fichou, X. Peng, Z. Xu, and F. Garnier, Solid State Commun. 72, 381 (1989).
2. K. Waragai, H. Akimichi, S. Hotta, H. Kano, and H. Sakaki, Phys. Rev. B 52, 1786 (1995).
3. A. Dodabalapur, H. E. Katz, L. Torsi, and R. C. Haddon, Science 269, 1560 (1995).
4. L. Torsi, A. Dodabalapur, L. J. Rothberg, A. W. P. Fung, and H. E. Katz, Science 272, 1462 (1996).
5. T. Holstein, Ann. Phys. (Paris) 8, 343 (1959).
6. A. J. Lovinger and L. J. Rothberg, J. Mater. Res. 11, 1581 (1996).
7. G. Horowitz, F. Garnier, A. Yassar, R. Hajlaoui, and F. Kouki, Adv. Mater. 8, 52 (1996).
8. W. A. Schoonveld, J. Vrijmoeth, and T. M. Klapwijk, unpublished results.
9. Crystals and the Polarizing Microscope, 4th ed (Edward Arnold ltd., London, 1970).
10. F. D. Bloss, An Introduction to the Method of Optical Crystallography, (Holt, Rinehart, and Winston, New York, 1962).
11. P. A. Chollet, Thin Solid Films 68, 13 (1980).
12. L. Servant and M. J. Dignam, Thin Solid Films 242, 21 (1994).
13. For quaterthiophene, the polymorphism such as that reported for sexithiophene (see Ref. 16) is absent for the wide temperature range studied here.
14. -1.
15. W. Porzio, S. Destri, M. Mascherpa, and S. Brückner, Acta Polym. 44, 266 (1993).
16. B. Servet, G. Horowitz, S. Ries, O. Lagorsse, P. Alnot, A. Yassar, F. Deloffre, P. Srivastava, R. Hajlaoui, P. Lang, and F. Garnier, Chem. Mater. 6, 1809 (1994).
17. S. Hotta and K. Waragai, Adv. Mater. 5, 896 (1993).
18. F. van Bolhuis, H. Wijnberg, E. E. Havinga, E. W. Meijer, and E. G. J. Staring, Synth. Met. 30, 381 (1989).
19. The magnetic permeability μ is assumed unity.
20. D. W. Berreman et al, J. Opt. Soc. Am. 62, 502 (1972);
21. see also D. W. Berreman and T. J. Scheffer, Phys. Rev. Lett. 25, 577 (1970).
22. M. Born and E. Wolf, Principles of Optics 5th Ed. (Pergamon, New York, 1975).
23. D. E. Aspnes and A. A. Studna, Phys. Rev. B 27, 985 (1983).
24. I. H. Malitson, J. Opt. Soc. Am. 55, 1205 (1965).
25. G. Wyszecki and W. S. Stiles, Color Science (Wiley, New York, 1966).
26. J. Kamler, Luminescent Screens, 2nd Ed. (Iliffe Books, London, 1969).
27. The experimental data have been obtained by integrating the reflected light over the same island area for each sample azimuth. This is realized by defining a circular area of integration in the digitized images.
28. c=93°, respectively.
29. The crystals have a random azimuthal orientation with respect to the polarization of the light, as is evident from optical microscopy.