Pore morphologies in disordered nanoporous thin films

Langmuir

Volumn 20, Issue 5, 2004, Pages 1535-1538

  Hedstrom, Jonathan A ^a   Toney, Michael F ^b   Huang, Elbert ^c   Kim, Ho Cheol ^a   Volksen, Willi ^a   Magbitang, Teddie ^a   Miller, Robert D ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MORPHOLOGY; PORE SIZE; POROSITY; THIN FILMS; X RAY SCATTERING;

DISORDERED NANOPOROUS THIN FILMS; PORE MORPHOLOGY;

NANOSTRUCTURED MATERIALS;

EID: 1542285098     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0351515     Document Type: Letter

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