Microstructure of novel superhard nanocrystalline-amorphous composites as analyzed by high resolution transmission electron microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 1, 1998, Pages 19-22

  Christiansen, S ^a   Albrecht, M ^a   Strunk, H P ^a   Veprek, Stan ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL MICROSTRUCTURE; GRAIN SIZE AND SHAPE; HARDNESS; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCRYSTALLINE AMORPHOUS COMPOSITES; PHASE SEGREGATION;

COMPOSITE MATERIALS;

EID: 11644305425     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589778     Document Type: Article

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