Microstructural analysis of a FeAl/quasicrystal-based composite prepared using a focused ion beam miller

Journal of Microscopy

Volumn 201, Issue 2, 2001, Pages 201-211

  Cairney, J M ^a,b   Munroe, P R ^a   Sordelet, D J ^c  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b IOWA STATE UNIVERSITY   (United States)

^c Materials Science and Engineering   (Australia)

Author keywords

Composite; FeAl; FIB; Intermetallic; Quasicrystal; TEM

Indexed keywords

ALUMINUM COATINGS; BINARY ALLOYS; CHROMIUM ALLOYS; COPPER ALLOYS; FOCUSED ION BEAMS; INTERMETALLICS; IRON ALLOYS; METAL SUBSTRATES; QUASICRYSTALS; SCANNING ELECTRON MICROSCOPY; TERNARY ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

BODY-CENTERED-CUBIC PHASE; FOCUSED IONS BEAMS; MICROSCOPE SPECIMENS; MICROSTRUCTURAL ANALYSIS; MULTIPHASE MATRICES; QUASICRYSTALLINE PHASE; QUASICRYSTALLINE PHASIS; STAINLESS STEEL SUBSTRATES; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPE;

ALUMINUM ALLOYS;

ALUMINUM DERIVATIVE; COPPER COMPLEX; IRON COMPLEX; STAINLESS STEEL;

ARTICLE; COATED PARTICLE; CRYSTAL; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ACRONICTA LEPORINA;

EID: 0035095056     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00764.x     Document Type: Article

References (23)

1. Coherent and incoherent equilibria in iron-rich iron-aluminium alloys
2. Mechanical properties of FeAl
3. Transmission electron microscope specimen preparation of metal matrix composites using the focused ion beam miller
4. The development of aligned precipitates during internal carbonitridaton of Fe-Ni-Cr alloys
5. The Al-Cu-Fe phase diagram: 0-25 at. pct Fe and 50-75 at. pct Al - Equilibria involving the icosahedral phase
6. A review of focused ion beam milling techniques for TEM specimen preparation
7. Ouasicrystal structure and properties
8. Cross-sectional TEM observation of multilayer structure of a galvannealed steel
9. Analytical electron microscopy of composite interfaces
10. A low magnification focused ion beam system with 8nm spot size
11. A focused ion beam system for sub-micron lithography
12. Focused ion beam technology and applications
13. Specimen preparation methods for the examination of surfaces and interfaces in the transmission electron microscope
14. Contrast mechanisms in focused ion beam milling
15. Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam
16. Selected properties of iron aluminides
17. Liquid-phase sintered iron aluminide-ceramic composites
18. Metallic phase with long-range orientational order and no translational symmetry
19. Abrasive wear behaviour of Al-Cu-Fe quasicrystalline composite coatings
20. A stable quasicrystal in the Al-Cu-Fe system
21. Mechanical behavior of quasicrystals
22. Surface damage of semiconductor TEM samples prepared by focused ion beams