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Volumn 111, Issue 2-3, 1999, Pages 199-209
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Microstructural characterization of binary and ternary hard coating system for wear protection. Part I: PVD coatings
a a a b |
Author keywords
Arc bond sputtering; Arc deposition; Magnetron sputtering; TEM; XTEM
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Indexed keywords
ALUMINUM NITRIDE;
CHROMIUM COMPOUNDS;
ELECTRON DIFFRACTION;
INTERFACES (MATERIALS);
MAGNETRON SPUTTERING;
PARTIAL PRESSURE;
PHYSICAL VAPOR DEPOSITION;
SILICON;
SPUTTER DEPOSITION;
STEEL;
TEXTURES;
TITANIUM NITRIDE;
TRANSMISSION ELECTRON MICROSCOPY;
WEAR OF MATERIALS;
WEAR RESISTANCE;
CRYSTAL MICROSTRUCTURE;
SUBSTRATES;
VAPOR DEPOSITION;
CHROMIUM NITRIDE;
TITANIUM ALUMINUM NITRIDE;
TITANIUM CHROMIUM NITRIDE;
ARC BOND SPUTTERING;
ARC DEPOSITION;
CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY (XTEM);
FACE CENTERED CUBIC (FCC) STRUCTURE;
HARD COATINGS;
PHYSICAL VAPOR DEPOSITION (PVD);
PROTECTIVE COATINGS;
COATING;
MICROSTRUCTURE;
SPUTTERING;
VAPOR DEPOSITION;
WEAR PREVENTION;
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EID: 0032653676
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(98)00735-X Document Type: Article |
Times cited : (33)
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References (42)
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