Advances in magnetic-based current imaging for high resistance defects and sub-micron resolution

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2004, Pages 267-270

  Knauss, L A ^a   Orozco, A ^a   Woods, S I ^a   Wang, Zhiyong ^b  

^a Neocera Inc   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAST FOURIER TRANSFORMS; IMAGING TECHNIQUES; INTEGRATED CIRCUITS; LEAKAGE CURRENTS; MAGNETIC FIELDS; MAGNETORESISTANCE; SENSORS; SHRINKAGE; SQUIDS;

HIGH RESISTANCE (HR) DEFECTS; MAGNETIC SENSORS; MAGNETIC-BASED CURRENT IMAGING; PLATED THROUGH HOLES (PTH);

MAGNETIC DEVICES;

EID: 14844300869     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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