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Volumn 69, Issue 3, 2004, Pages
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Band discontinuity at ultrathin SiO2/Si(001) interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
SILICON;
SILICON DIOXIDE;
ARTICLE;
CHEMICAL STRUCTURE;
DENSITY FUNCTIONAL THEORY;
ENERGY;
QUANTUM MECHANICS;
SEMICONDUCTOR;
SURFACE PROPERTY;
THICKNESS;
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EID: 1442263735
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.69.035312 Document Type: Article |
Times cited : (17)
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References (21)
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