Crystalline Si/SiO2 quantum wells

Applied Physics Letters

Volumn 80, Issue 2, 2002, Pages 255-257

  Lu, Z H ^a   Grozea, D ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY DEPTH PROFILES; BAND EDGE; BAND GAPS; CHEMICAL COMPOSITIONS; CONDUCTION-BAND MINIMUM; CRYSTALLINE SI; CRYSTALLINE STRUCTURE; EPITAXIAL LAYER TRANSFERS; EXPERIMENTAL DATA; QUANTUM WELL SYSTEMS; SI LAYER; SILICON ON INSULATOR WAFERS; SYNCHROTRON X RAYS; VALENCE-BAND MAXIMUMS; X RAY PHOTO-ELECTRON DIFFRACTION;

AUGER ELECTRON SPECTROSCOPY; CRYSTALLINE MATERIALS; PHOTONS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 79955988632     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1433166     Document Type: Article

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