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Volumn 357-358, Issue , 1996, Pages 896-899
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Initial growth stage of CaF2 on Si(111)-7 × 7 studied by high temperature UHV-STM
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
CRYSTAL GROWTH;
CRYSTAL STRUCTURE;
DEPOSITION;
EPITAXIAL GROWTH;
FLUORINE COMPOUNDS;
HIGH TEMPERATURE EFFECTS;
INTERFACES (MATERIALS);
MONOLAYERS;
SEMICONDUCTING SILICON;
SUBSTRATES;
THREE DIMENSIONAL;
CALCIUM FLUORIDES;
HETEROEPITAXIAL MONOLAYERS;
THREE DIMENSIONAL ISLAND FORMATION;
ULTRAHIGH VACUUM SCANNING TUNNELING MICROSCOPE;
WELL ORDERED ROW LIKE STRUCTURE;
WETTING HETEROEPITAXIAL LAYER GROWTH;
SCANNING TUNNELING MICROSCOPY;
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EID: 13544264908
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(96)00287-7 Document Type: Article |
Times cited : (22)
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References (11)
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