Growth of CaF2 on Si(111): Imaging of the CaF interface by friction force microscopy

Applied Physics Letters

Volumn 73, Issue 14, 1998, Pages 1967-1969

  Klust, Andreas ^a   Pietsch, Holger ^a   Wollschläger, Joachim ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006200075     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122337     Document Type: Article

References (12)

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