Nanoparticle arrays patterned by electron-beam writing: Structure, composition, and electrical properties

Langmuir

Volumn 21, Issue 4, 2005, Pages 1556-1559

  Plaza, Jose L ^a   Chen, Yu ^a   Jacke, Susanne ^a   Palmer, Richard E ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARRAYS; ATOMIC FORCE MICROSCOPY; CARBON; ELECTRIC CONDUCTIVITY; ELECTRODES; ELECTRON BEAMS; ENERGY DISPERSIVE SPECTROSCOPY; GOLD; MORPHOLOGY; PHOTOLITHOGRAPHY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SUBSTRATES; THIN FILMS;

METAL CORES; NANOSCALE WIRES; ORGANIC LIGANDS; TUNNELING GAPS;

NANOSTRUCTURED MATERIALS;

EID: 14044262760     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la047777g     Document Type: Article

References (28)

1. (a) Khairutdinov, R. F. Colloid J. 1997, 59, 535.
2. (b) Alivisatos, A. P. J. Phys. Chem. 1996, 100, 13226.
3. (c) Alvarez, M. M.; Khoury, J. T.; Schaaff, T. G.; Shafigullin, M. N.; Vezmar, I.; Whetten, R. L. J. Phys. Chem. B 1997, 101, 3706.
4. (d) Lewis, L. N. Chem. Rev. 1993, 93, 2693.
5. (e) Li, Y.; El-Sayed, M. A. J. Phys. Chem. B 2001, 105, 8938.
6. (f) Boyen, H. G.; Kastle, G.; Weigl, F.; Koslowski, B.; Dietrich, C.; Ziemann, P.; Spatz, J. P.; Riethmuller, S.; Hartmann, C.; Moller, M.; Schmid, G.; Garnier, M. G.; Oelhafen, P. Science 2002, 297, 1533.
7. (g) Durston, P. J.; Palmer, R. E.; Wilcoxon, J. P. Appl. Phys. Lett. 1998, 72, 176.
8. (h) Palmer, R. E.; Guo, Q. Phys. Chem. Chem, Phys. 2002, 4, 4275.
9. Warner, M. G.; Hutchison, J. E. Nature Mater. 2003, 2, 272.
10. Mendes,P. M.; Jacke,S.;Critchley, K.; Plaza, J.; Chen, Y.; Nikitin, K.; Palmer, R. E.; Preece, J. A.; Evans, S. D.; Fitzmaurice, D. Langmuir 2004, 20, 3766.
11. (a) Bedson, T. R.; Palmer, R. E.; Wilcoxon, J. P. Appl. Phys. Lett. 2001, 78, 2061.
12. (b) Bedson, T. R.; Jenkins, T. E.; Hayton, D. J.; Wilcoxon, J. P.; Palmer, R. E. Appl. Phys. Lett. 2001, 78, 1921.
13. Chen, Y.; Palmer, R. E. In Electron beam writing in nanoparticle films, Encyclopaedia of Nanoscience and Nanotechnology, Nalwa, H. S., Ed.; American Scientific Publishers: Stevenson Ranch, CA, USA, 2004; Vol. 3, pp 17-28.
14. Mendes, P. M.; Chen, Y.; Palmer, R. E.; Nikitin, K.; Fitzmaurice, D.; Preece, J. A. J. Phys.: Condens. Matter 2003, 15, S3047.
15. (a) Wybourne, M. N.; Clarke, L.; Yan, M.; Cai, S. X.; Brown, L. O.; Hutchinson, J.; Keana, J. F. W. Jpn. J. Appl. Phys., Part 1 1997, 36, 7796.
16. (b) Clarke, L.; Wybourne, M. N.; Yan, M.; Cai, S. X.; Keana, J. F. W. Appl. Phys. Lett. 1997, 71, 617.
17. (c) Clarke, L.; Wybourne, M. N.; Yan, M.; Cai, S. X.; Brown, L. O.; Hutchinson, J.; Keana, J. F. W. J. Vac. Sci. Technol. B 1997, 15, 2925.
18. (d) Reetz, M. T.; Winner, M. J. Am. Chem. Soc. 1997, 119, 4539.
19. (e) Lohau, J.; Friedrichowski, S.; Dumpich, G; Wassermann, E. F.; Winner, M.; Reetz, M. T. J. Vac. Sci. Technol. B 1998, 16, 77.
20. (f) Dumpich, G.; Lohau, J.; Wassermann, E. F.; Winner, M.; Reetz, M. T. Mater. Sci. Forum 1998, 287-288, 413.
21. Lin, X. M.; Parthasarathy, R.; Jaeger, H. M. Appl. Phys. Lett. 2001, 78, 1915.
22. Werts, M. H. V.; Lambert, M.; Boourgoin, J. P.; Brust, M. Nano Lett. 2002, 2, 43.
23. Wilcoxon, J. P.; Williamson, R. L.; Baughman, R. J. J. Chem. Phys. 1993, 98, 9933.
24. Keyse, R. J.; Garratt-Reed, A. J.; Goodhew, P. J.; Lorimer, G. W. Introduction to Scanning Transmission Electron Microscopy; βios Scientific Publishers Ltd, Oxford, UK, 1998.
25. (a) Zharnikov, M.; Geyer, W.; Golzhauser, A.; Frey, S.; Grunze, M. Phys. Chem. Chem. Phys. 1999, 1, 3163.
26. (b) Zharnikov, M.; Frey, S.; Heister, K.; Grunze, M. Langmuir 2000, 16, 2697.
27. (c) Heister, K.; Zharnikov, M.; Grunze, M. Langmuir 2001, 17, 8.
28. Tada, T.; Kanayama, T.; Robinson, A. P. G.; Palmer, R. E.; Allen, M. T.; Preece, J. A.; Harris, K. D. M. Microelectron. Eng. 2000, 53, 425.