Study of transparent ferroelectric thin films by optical reflectometry and ellipsometry

Journal of Optoelectronics and Advanced Materials

Volumn 5, Issue 3, 2003, Pages 755-761

  Aulika, I ^a   Zauls, V ^a   Kundzins, K ^a   Kundzins, M ^a   Katholy, S ^b  

^a UNIVERSITY OF LATVIA   (Latvia)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

Absorption coefficient; Ellipsometry; Reflectometry; Refractive index

Indexed keywords

ABSORPTION; BARIUM COMPOUNDS; ELLIPSOMETRY; LASER ABLATION; LEAD COMPOUNDS; PHONONS; REFLECTOMETERS; REFRACTIVE INDEX; SOL-GELS; SPUTTERING; THIN FILMS;

NON-LINEAR SUSCEPTIBILITY; OPTICAL REFLECTOMETRY;

FERROELECTRIC MATERIALS;

EID: 0347595121     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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