메뉴 건너뛰기




Volumn 76, Issue 2, 2005, Pages

SSIOD: The next generation

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); DETECTORS; OPTICAL DESIGN; OPTICAL RESOLVING POWER; STRESS ANALYSIS; ULTRAHIGH VACUUM;

EID: 13744255749     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1844191     Document Type: Article
Times cited : (6)

References (59)
  • 38
    • 13744263988 scopus 로고    scopus 로고
    • note
    • Footnote 1: Still, if angular fluctuations of the beam are present, a net effect will occur even at a differential setup.
  • 45
    • 13744263987 scopus 로고    scopus 로고
    • Ph.D. thesis, Arizona State University
    • D. G. Waters, Ph.D. thesis, Arizona State University (2000).
    • (2000)
    • Waters, D.G.1
  • 57
    • 13744258992 scopus 로고    scopus 로고
    • Masters thesis, Institute for Laser and Plasma Physics, University of Essen
    • T. Grabosch, Masters thesis, Institute for Laser and Plasma Physics, University of Essen (2001).
    • (2001)
    • Grabosch, T.1
  • 59
    • 13744254298 scopus 로고    scopus 로고
    • note
    • Footnote 2: "Resolution" in surface stress measurements is usually meant as the noise-equivalent signal, that is a signal with a statistical significance of 1σ. It should be noted that this definition makes il critical lo estimate the sensitivity of a specific experimental setup by the detectable bending radius alone: the mechanical noises are reduced by using a thicker sample and therefore the noise-equivalent signal gets smaller, but in fact the stress detection limit will increase, since it scales with the square of the sample thickness [see Eq. (1)].


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.