Phase coexistence during surface phase transitions

Physical Review Letters

Volumn 86, Issue 21, 2001, Pages 4871-4874

  Hannon, J B ^a   Meyer zu Heringdorf, F J ^a   Tersoff, J ^a   Tromp, R M ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; ELECTRON MICROSCOPY; ELECTROSTATICS; LATTICE CONSTANTS; SILICON; SURFACE STRUCTURE; THERMAL EFFECTS; THERMODYNAMIC PROPERTIES;

LOW ENERGY ELECTRON MICROSCOPY; PHASE COEXISTENCE;

PHASE TRANSITIONS;

EID: 0035926620     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.4871     Document Type: Article

References (21)