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Volumn 22, Issue 6, 2004, Pages 3493-3496

Lithographic patterning of a highly metallized polymer resist system and pyrolytic or plasma treatment to afford ferromagnetic ceramics

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATALYSIS; CERAMIC MATERIALS; FERRIMAGNETIC MATERIALS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; POLYMERS; PYROLYSIS; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 13244279793     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1821507     Document Type: Conference Paper
Times cited : (4)

References (36)
  • 2
    • 0346101515 scopus 로고    scopus 로고
    • For recent examples see H. F. Hamann, S. I. Woods, and S. Sun, Nano Lett. 3, 1643 (2003); M.H. V. Werts, M. Lambert, J.-P. Bourgoin, and M. Brust, ibid. 2, 43 (2002); T. R. Bedson, R. E. Palmer, and J. P. Wilcoxon, Microelectron. Eng. 57-58, 837 (2001); J. Lohau, S. Friedrichowski, G. Dumpich, E. F. Wassermann, M. Winter, and M. T. Reetz, J. Vac. Sci. Technol. B 16, 77 (1998), and references cited therein.
    • (2003) Nano Lett. , vol.3 , pp. 1643
    • Hamann, H.F.1    Woods, S.I.2    Sun, S.3
  • 3
    • 0002731208 scopus 로고    scopus 로고
    • For recent examples see H. F. Hamann, S. I. Woods, and S. Sun, Nano Lett. 3, 1643 (2003); M.H. V. Werts, M. Lambert, J.-P. Bourgoin, and M. Brust, ibid. 2, 43 (2002); T. R. Bedson, R. E. Palmer, and J. P. Wilcoxon, Microelectron. Eng. 57-58, 837 (2001); J. Lohau, S. Friedrichowski, G. Dumpich, E. F. Wassermann, M. Winter, and M. T. Reetz, J. Vac. Sci. Technol. B 16, 77 (1998), and references cited therein.
    • (2002) Nano Lett. , vol.2 , pp. 43
    • Werts, M.H.V.1    Lambert, M.2    Bourgoin, J.-P.3    Brust, M.4
  • 4
    • 0035450832 scopus 로고    scopus 로고
    • For recent examples see H. F. Hamann, S. I. Woods, and S. Sun, Nano Lett. 3, 1643 (2003); M.H. V. Werts, M. Lambert, J.-P. Bourgoin, and M. Brust, ibid. 2, 43 (2002); T. R. Bedson, R. E. Palmer, and J. P. Wilcoxon, Microelectron. Eng. 57-58, 837 (2001); J. Lohau, S. Friedrichowski, G. Dumpich, E. F. Wassermann, M. Winter, and M. T. Reetz, J. Vac. Sci. Technol. B 16, 77 (1998), and references cited therein.
    • (2001) Microelectron. Eng. , vol.57-58 , pp. 837
    • Bedson, T.R.1    Palmer, R.E.2    Wilcoxon, J.P.3
  • 5
    • 0002266993 scopus 로고    scopus 로고
    • and references cited therein
    • For recent examples see H. F. Hamann, S. I. Woods, and S. Sun, Nano Lett. 3, 1643 (2003); M.H. V. Werts, M. Lambert, J.-P. Bourgoin, and M. Brust, ibid. 2, 43 (2002); T. R. Bedson, R. E. Palmer, and J. P. Wilcoxon, Microelectron. Eng. 57-58, 837 (2001); J. Lohau, S. Friedrichowski, G. Dumpich, E. F. Wassermann, M. Winter, and M. T. Reetz, J. Vac. Sci. Technol. B 16, 77 (1998), and references cited therein.
    • (1998) J. Vac. Sci. Technol. B , vol.16 , pp. 77
    • Lohau, J.1    Friedrichowski, S.2    Dumpich, G.3    Wassermann, E.F.4    Winter, M.5    Reetz, M.T.6
  • 6
    • 0345550395 scopus 로고    scopus 로고
    • For recent examples see M. S. M. Saifullah, K. R. V. Subramanian, E. Tapley, D.-J. Kang, M. E. Weiland, and M. Butler, Nano Lett. 3, 1587 (2003); M. Alexe, C. Harnagea, W. Erfurth, D. Hesse, and U. Gösele, Appl. Phys. A: Mater. Sci. Process. 70, 247 (2000); H.W. P. Koops, A. Kaya, and M. Weber, J. Vac. Sci. Technol. B 13, 2400 (1995), and references cited therein.
    • (2003) Nano Lett. , vol.3 , pp. 1587
    • Saifullah, M.S.M.1    Subramanian, K.R.V.2    Tapley, E.3    Kang, D.-J.4    Weiland, M.E.5    Butler, M.6
  • 7
    • 0034156390 scopus 로고    scopus 로고
    • For recent examples see M. S. M. Saifullah, K. R. V. Subramanian, E. Tapley, D.-J. Kang, M. E. Weiland, and M. Butler, Nano Lett. 3, 1587 (2003); M. Alexe, C. Harnagea, W. Erfurth, D. Hesse, and U. Gösele, Appl. Phys. A: Mater. Sci. Process. 70, 247 (2000); H.W. P. Koops, A. Kaya, and M. Weber, J. Vac. Sci. Technol. B 13, 2400 (1995), and references cited therein.
    • (2000) Appl. Phys. A: Mater. Sci. Process. , vol.70 , pp. 247
    • Alexe, M.1    Harnagea, C.2    Erfurth, W.3    Hesse, D.4    Gösele, U.5
  • 8
    • 0345550395 scopus 로고    scopus 로고
    • and references cited therein
    • For recent examples see M. S. M. Saifullah, K. R. V. Subramanian, E. Tapley, D.-J. Kang, M. E. Weiland, and M. Butler, Nano Lett. 3, 1587 (2003); M. Alexe, C. Harnagea, W. Erfurth, D. Hesse, and U. Gösele, Appl. Phys. A: Mater. Sci. Process. 70, 247 (2000); H.W. P. Koops, A. Kaya, and M. Weber, J. Vac. Sci. Technol. B 13, 2400 (1995), and references cited therein.
    • (1995) J. Vac. Sci. Technol. B , vol.13 , pp. 2400
    • Koops, H.W.P.1    Kaya, A.2    Weber, M.3
  • 14
    • 0021377149 scopus 로고
    • G. N. Taylor, T. M. Wolf, and L. E. Stillwagon, Semicond. Sci. Technol. 27, 145 (1984); I. Brodie and J. J. Muray, The Physics of Micro/ Nano-Fabrication (Plenum, New York, 1992); T. Deng, Y.-H. Ha, J. Y. Cheng, C. A. Ross, and E. L. Thomas, Langmuir 18, 6719 (2002); G. N. Taylor, M. Y. Hellman, T. M. Wolf, and J. M. Zeigler, Advances in Resist Technology and Processing V; SPIE Vol. 920; SPIE (Bellingham, WA, 1988), pp. 274-290.
    • (1984) Semicond. Sci. Technol. , vol.27 , pp. 145
    • Taylor, G.N.1    Wolf, T.M.2    Stillwagon, L.E.3
  • 15
    • 0021377149 scopus 로고
    • Plenum, New York
    • G. N. Taylor, T. M. Wolf, and L. E. Stillwagon, Semicond. Sci. Technol. 27, 145 (1984); I. Brodie and J. J. Muray, The Physics of Micro/ Nano-Fabrication (Plenum, New York, 1992); T. Deng, Y.-H. Ha, J. Y. Cheng, C. A. Ross, and E. L. Thomas, Langmuir 18, 6719 (2002); G. N. Taylor, M. Y. Hellman, T. M. Wolf, and J. M. Zeigler, Advances in Resist Technology and Processing V; SPIE Vol. 920; SPIE (Bellingham, WA, 1988), pp. 274-290.
    • (1992) The Physics of Micro/Nano-fabrication
    • Brodie, I.1    Muray, J.J.2
  • 16
    • 0037015332 scopus 로고    scopus 로고
    • G. N. Taylor, T. M. Wolf, and L. E. Stillwagon, Semicond. Sci. Technol. 27, 145 (1984); I. Brodie and J. J. Muray, The Physics of Micro/ Nano-Fabrication (Plenum, New York, 1992); T. Deng, Y.-H. Ha, J. Y. Cheng, C. A. Ross, and E. L. Thomas, Langmuir 18, 6719 (2002); G. N. Taylor, M. Y. Hellman, T. M. Wolf, and J. M. Zeigler, Advances in Resist Technology and Processing V; SPIE Vol. 920; SPIE (Bellingham, WA, 1988), pp. 274-290.
    • (2002) Langmuir , vol.18 , pp. 6719
    • Deng, T.1    Ha, Y.-H.2    Cheng, J.Y.3    Ross, C.A.4    Thomas, E.L.5
  • 17
    • 3643068054 scopus 로고
    • SPIE; SPIE (Bellingham, WA)
    • G. N. Taylor, T. M. Wolf, and L. E. Stillwagon, Semicond. Sci. Technol. 27, 145 (1984); I. Brodie and J. J. Muray, The Physics of Micro/ Nano-Fabrication (Plenum, New York, 1992); T. Deng, Y.-H. Ha, J. Y. Cheng, C. A. Ross, and E. L. Thomas, Langmuir 18, 6719 (2002); G. N. Taylor, M. Y. Hellman, T. M. Wolf, and J. M. Zeigler, Advances in Resist Technology and Processing V; SPIE Vol. 920; SPIE (Bellingham, WA, 1988), pp. 274-290.
    • (1988) Advances in Resist Technology and Processing V , vol.920 , pp. 274-290
    • Taylor, G.N.1    Hellman, M.Y.2    Wolf, T.M.3    Zeigler, J.M.4
  • 18
    • 0035941073 scopus 로고    scopus 로고
    • I. Manners, Science 294, 1664 (2001); K. Kulbaba and I. Manners, Macromol. Rapid Commun. 22, 711 (2001).
    • (2001) Science , vol.294 , pp. 1664
    • Manners, I.1
  • 20
    • 0034712087 scopus 로고    scopus 로고
    • M. J. MacLachlan et al., Science 287, 1460 (2000); K. Temple et al., Adv. Mater. 15, 297 (2003).
    • (2000) Science , vol.287 , pp. 1460
    • MacLachlan, M.J.1
  • 21
    • 0037450280 scopus 로고    scopus 로고
    • M. J. MacLachlan et al., Science 287, 1460 (2000); K. Temple et al., Adv. Mater. 15, 297 (2003).
    • (2003) Adv. Mater. , vol.15 , pp. 297
    • Temple, K.1
  • 23
    • 10744220085 scopus 로고    scopus 로고
    • Full experimental details can be found in S. B. Clendenning et al., Adv. Mater. 16, 215 (2004).
    • (2004) Adv. Mater. , vol.16 , pp. 215
    • Clendenning, S.B.1
  • 24
    • 13244289020 scopus 로고    scopus 로고
    • note
    • To date the smallest features patterned by EBL using a Co-PFS resist are 200 nm.
  • 26
    • 0034829550 scopus 로고    scopus 로고
    • J. A. Massey et al., J. Am. Chem. Soc. 123, 3147 (2001); L. Cao et al., Adv. Funct. Mater. 13, 271 (2003).
    • (2001) J. Am. Chem. Soc. , vol.123 , pp. 3147
    • Massey, J.A.1
  • 27
    • 0037509853 scopus 로고    scopus 로고
    • J. A. Massey et al., J. Am. Chem. Soc. 123, 3147 (2001); L. Cao et al., Adv. Funct. Mater. 13, 271 (2003).
    • (2003) Adv. Funct. Mater. , vol.13 , pp. 271
    • Cao, L.1
  • 30
    • 12144290300 scopus 로고    scopus 로고
    • Full experimental details can be found in S. B. Clendenning et al., Adv. Mater. 16, 291 (2004).
    • (2004) Adv. Mater. , vol.16 , pp. 291
    • Clendenning, S.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.