-
1
-
-
0035901999
-
-
K. E. Gonsalves, L. Merhari, H. Wu, and Y. Hu, Adv. Mater. 13, 703 (2001).
-
(2001)
Adv. Mater.
, vol.13
, pp. 703
-
-
Gonsalves, K.E.1
Merhari, L.2
Wu, H.3
Hu, Y.4
-
2
-
-
0346101515
-
-
For recent examples see H. F. Hamann, S. I. Woods, and S. Sun, Nano Lett. 3, 1643 (2003); M.H. V. Werts, M. Lambert, J.-P. Bourgoin, and M. Brust, ibid. 2, 43 (2002); T. R. Bedson, R. E. Palmer, and J. P. Wilcoxon, Microelectron. Eng. 57-58, 837 (2001); J. Lohau, S. Friedrichowski, G. Dumpich, E. F. Wassermann, M. Winter, and M. T. Reetz, J. Vac. Sci. Technol. B 16, 77 (1998), and references cited therein.
-
(2003)
Nano Lett.
, vol.3
, pp. 1643
-
-
Hamann, H.F.1
Woods, S.I.2
Sun, S.3
-
3
-
-
0002731208
-
-
For recent examples see H. F. Hamann, S. I. Woods, and S. Sun, Nano Lett. 3, 1643 (2003); M.H. V. Werts, M. Lambert, J.-P. Bourgoin, and M. Brust, ibid. 2, 43 (2002); T. R. Bedson, R. E. Palmer, and J. P. Wilcoxon, Microelectron. Eng. 57-58, 837 (2001); J. Lohau, S. Friedrichowski, G. Dumpich, E. F. Wassermann, M. Winter, and M. T. Reetz, J. Vac. Sci. Technol. B 16, 77 (1998), and references cited therein.
-
(2002)
Nano Lett.
, vol.2
, pp. 43
-
-
Werts, M.H.V.1
Lambert, M.2
Bourgoin, J.-P.3
Brust, M.4
-
4
-
-
0035450832
-
-
For recent examples see H. F. Hamann, S. I. Woods, and S. Sun, Nano Lett. 3, 1643 (2003); M.H. V. Werts, M. Lambert, J.-P. Bourgoin, and M. Brust, ibid. 2, 43 (2002); T. R. Bedson, R. E. Palmer, and J. P. Wilcoxon, Microelectron. Eng. 57-58, 837 (2001); J. Lohau, S. Friedrichowski, G. Dumpich, E. F. Wassermann, M. Winter, and M. T. Reetz, J. Vac. Sci. Technol. B 16, 77 (1998), and references cited therein.
-
(2001)
Microelectron. Eng.
, vol.57-58
, pp. 837
-
-
Bedson, T.R.1
Palmer, R.E.2
Wilcoxon, J.P.3
-
5
-
-
0002266993
-
-
and references cited therein
-
For recent examples see H. F. Hamann, S. I. Woods, and S. Sun, Nano Lett. 3, 1643 (2003); M.H. V. Werts, M. Lambert, J.-P. Bourgoin, and M. Brust, ibid. 2, 43 (2002); T. R. Bedson, R. E. Palmer, and J. P. Wilcoxon, Microelectron. Eng. 57-58, 837 (2001); J. Lohau, S. Friedrichowski, G. Dumpich, E. F. Wassermann, M. Winter, and M. T. Reetz, J. Vac. Sci. Technol. B 16, 77 (1998), and references cited therein.
-
(1998)
J. Vac. Sci. Technol. B
, vol.16
, pp. 77
-
-
Lohau, J.1
Friedrichowski, S.2
Dumpich, G.3
Wassermann, E.F.4
Winter, M.5
Reetz, M.T.6
-
6
-
-
0345550395
-
-
For recent examples see M. S. M. Saifullah, K. R. V. Subramanian, E. Tapley, D.-J. Kang, M. E. Weiland, and M. Butler, Nano Lett. 3, 1587 (2003); M. Alexe, C. Harnagea, W. Erfurth, D. Hesse, and U. Gösele, Appl. Phys. A: Mater. Sci. Process. 70, 247 (2000); H.W. P. Koops, A. Kaya, and M. Weber, J. Vac. Sci. Technol. B 13, 2400 (1995), and references cited therein.
-
(2003)
Nano Lett.
, vol.3
, pp. 1587
-
-
Saifullah, M.S.M.1
Subramanian, K.R.V.2
Tapley, E.3
Kang, D.-J.4
Weiland, M.E.5
Butler, M.6
-
7
-
-
0034156390
-
-
For recent examples see M. S. M. Saifullah, K. R. V. Subramanian, E. Tapley, D.-J. Kang, M. E. Weiland, and M. Butler, Nano Lett. 3, 1587 (2003); M. Alexe, C. Harnagea, W. Erfurth, D. Hesse, and U. Gösele, Appl. Phys. A: Mater. Sci. Process. 70, 247 (2000); H.W. P. Koops, A. Kaya, and M. Weber, J. Vac. Sci. Technol. B 13, 2400 (1995), and references cited therein.
-
(2000)
Appl. Phys. A: Mater. Sci. Process.
, vol.70
, pp. 247
-
-
Alexe, M.1
Harnagea, C.2
Erfurth, W.3
Hesse, D.4
Gösele, U.5
-
8
-
-
0345550395
-
-
and references cited therein
-
For recent examples see M. S. M. Saifullah, K. R. V. Subramanian, E. Tapley, D.-J. Kang, M. E. Weiland, and M. Butler, Nano Lett. 3, 1587 (2003); M. Alexe, C. Harnagea, W. Erfurth, D. Hesse, and U. Gösele, Appl. Phys. A: Mater. Sci. Process. 70, 247 (2000); H.W. P. Koops, A. Kaya, and M. Weber, J. Vac. Sci. Technol. B 13, 2400 (1995), and references cited therein.
-
(1995)
J. Vac. Sci. Technol. B
, vol.13
, pp. 2400
-
-
Koops, H.W.P.1
Kaya, A.2
Weber, M.3
-
10
-
-
36449005337
-
-
J. Fujita, H. Watanabe, Y. Ochiai, S. Manako, J. S. Tsai, and S. Matsui, Appl. Phys. Lett. 66, 3064 (1995); H. Watanabe, J. Fujita, Y. Ochiai, S. Matsui, and M. Ichikawa, Jpn. J. Appl. Phys. 34, 6950 (1995).
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 3064
-
-
Fujita, J.1
Watanabe, H.2
Ochiai, Y.3
Manako, S.4
Tsai, J.S.5
Matsui, S.6
-
11
-
-
0029542292
-
-
J. Fujita, H. Watanabe, Y. Ochiai, S. Manako, J. S. Tsai, and S. Matsui, Appl. Phys. Lett. 66, 3064 (1995); H. Watanabe, J. Fujita, Y. Ochiai, S. Matsui, and M. Ichikawa, Jpn. J. Appl. Phys. 34, 6950 (1995).
-
(1995)
Jpn. J. Appl. Phys.
, vol.34
, pp. 6950
-
-
Watanabe, H.1
Fujita, J.2
Ochiai, Y.3
Matsui, S.4
Ichikawa, M.5
-
14
-
-
0021377149
-
-
G. N. Taylor, T. M. Wolf, and L. E. Stillwagon, Semicond. Sci. Technol. 27, 145 (1984); I. Brodie and J. J. Muray, The Physics of Micro/ Nano-Fabrication (Plenum, New York, 1992); T. Deng, Y.-H. Ha, J. Y. Cheng, C. A. Ross, and E. L. Thomas, Langmuir 18, 6719 (2002); G. N. Taylor, M. Y. Hellman, T. M. Wolf, and J. M. Zeigler, Advances in Resist Technology and Processing V; SPIE Vol. 920; SPIE (Bellingham, WA, 1988), pp. 274-290.
-
(1984)
Semicond. Sci. Technol.
, vol.27
, pp. 145
-
-
Taylor, G.N.1
Wolf, T.M.2
Stillwagon, L.E.3
-
15
-
-
0021377149
-
-
Plenum, New York
-
G. N. Taylor, T. M. Wolf, and L. E. Stillwagon, Semicond. Sci. Technol. 27, 145 (1984); I. Brodie and J. J. Muray, The Physics of Micro/ Nano-Fabrication (Plenum, New York, 1992); T. Deng, Y.-H. Ha, J. Y. Cheng, C. A. Ross, and E. L. Thomas, Langmuir 18, 6719 (2002); G. N. Taylor, M. Y. Hellman, T. M. Wolf, and J. M. Zeigler, Advances in Resist Technology and Processing V; SPIE Vol. 920; SPIE (Bellingham, WA, 1988), pp. 274-290.
-
(1992)
The Physics of Micro/Nano-fabrication
-
-
Brodie, I.1
Muray, J.J.2
-
16
-
-
0037015332
-
-
G. N. Taylor, T. M. Wolf, and L. E. Stillwagon, Semicond. Sci. Technol. 27, 145 (1984); I. Brodie and J. J. Muray, The Physics of Micro/ Nano-Fabrication (Plenum, New York, 1992); T. Deng, Y.-H. Ha, J. Y. Cheng, C. A. Ross, and E. L. Thomas, Langmuir 18, 6719 (2002); G. N. Taylor, M. Y. Hellman, T. M. Wolf, and J. M. Zeigler, Advances in Resist Technology and Processing V; SPIE Vol. 920; SPIE (Bellingham, WA, 1988), pp. 274-290.
-
(2002)
Langmuir
, vol.18
, pp. 6719
-
-
Deng, T.1
Ha, Y.-H.2
Cheng, J.Y.3
Ross, C.A.4
Thomas, E.L.5
-
17
-
-
3643068054
-
-
SPIE; SPIE (Bellingham, WA)
-
G. N. Taylor, T. M. Wolf, and L. E. Stillwagon, Semicond. Sci. Technol. 27, 145 (1984); I. Brodie and J. J. Muray, The Physics of Micro/ Nano-Fabrication (Plenum, New York, 1992); T. Deng, Y.-H. Ha, J. Y. Cheng, C. A. Ross, and E. L. Thomas, Langmuir 18, 6719 (2002); G. N. Taylor, M. Y. Hellman, T. M. Wolf, and J. M. Zeigler, Advances in Resist Technology and Processing V; SPIE Vol. 920; SPIE (Bellingham, WA, 1988), pp. 274-290.
-
(1988)
Advances in Resist Technology and Processing V
, vol.920
, pp. 274-290
-
-
Taylor, G.N.1
Hellman, M.Y.2
Wolf, T.M.3
Zeigler, J.M.4
-
18
-
-
0035941073
-
-
I. Manners, Science 294, 1664 (2001); K. Kulbaba and I. Manners, Macromol. Rapid Commun. 22, 711 (2001).
-
(2001)
Science
, vol.294
, pp. 1664
-
-
Manners, I.1
-
20
-
-
0034712087
-
-
M. J. MacLachlan et al., Science 287, 1460 (2000); K. Temple et al., Adv. Mater. 15, 297 (2003).
-
(2000)
Science
, vol.287
, pp. 1460
-
-
MacLachlan, M.J.1
-
21
-
-
0037450280
-
-
M. J. MacLachlan et al., Science 287, 1460 (2000); K. Temple et al., Adv. Mater. 15, 297 (2003).
-
(2003)
Adv. Mater.
, vol.15
, pp. 297
-
-
Temple, K.1
-
23
-
-
10744220085
-
-
Full experimental details can be found in S. B. Clendenning et al., Adv. Mater. 16, 215 (2004).
-
(2004)
Adv. Mater.
, vol.16
, pp. 215
-
-
Clendenning, S.B.1
-
24
-
-
13244289020
-
-
note
-
To date the smallest features patterned by EBL using a Co-PFS resist are 200 nm.
-
-
-
-
25
-
-
1942468026
-
-
Full experimental details can be found in A. Y. Cheng, S. B. Clendenning, G. Yang, Z.-H. Lu, C. M. Yip, and I. Manners, Chem. Commun. (Cambridge) 2004, 780 (2004).
-
(2004)
Chem. Commun. (Cambridge)
, vol.2004
, pp. 780
-
-
Cheng, A.Y.1
Clendenning, S.B.2
Yang, G.3
Lu, Z.-H.4
Yip, C.M.5
Manners, I.6
-
26
-
-
0034829550
-
-
J. A. Massey et al., J. Am. Chem. Soc. 123, 3147 (2001); L. Cao et al., Adv. Funct. Mater. 13, 271 (2003).
-
(2001)
J. Am. Chem. Soc.
, vol.123
, pp. 3147
-
-
Massey, J.A.1
-
27
-
-
0037509853
-
-
J. A. Massey et al., J. Am. Chem. Soc. 123, 3147 (2001); L. Cao et al., Adv. Funct. Mater. 13, 271 (2003).
-
(2003)
Adv. Funct. Mater.
, vol.13
, pp. 271
-
-
Cao, L.1
-
28
-
-
0033639841
-
-
R. G. H. Lammertink, M. A. Hempenius, J. E. van den Enk, V. Z.-H. Chan, E. L. Thomas, and G. J. Vancso, Adv. Mater. 12, 98 (2000); R.G. H. Lammertink, M. A. Hempenius, V. Z.-H. Chan, E. L. Thomas, and G. J. Vancso, Chem. Mater. 13, 429 (2001).
-
(2000)
Adv. Mater.
, vol.12
, pp. 98
-
-
Lammertink, R.G.H.1
Hempenius, M.A.2
Van Den Enk, J.E.3
Chan, V.Z.-H.4
Thomas, E.L.5
Vancso, G.J.6
-
29
-
-
0035093313
-
-
R. G. H. Lammertink, M. A. Hempenius, J. E. van den Enk, V. Z.-H. Chan, E. L. Thomas, and G. J. Vancso, Adv. Mater. 12, 98 (2000); R.G. H. Lammertink, M. A. Hempenius, V. Z.-H. Chan, E. L. Thomas, and G. J. Vancso, Chem. Mater. 13, 429 (2001).
-
(2001)
Chem. Mater.
, vol.13
, pp. 429
-
-
Lammertink, R.G.H.1
Hempenius, M.A.2
Chan, V.Z.-H.3
Thomas, E.L.4
Vancso, G.J.5
-
30
-
-
12144290300
-
-
Full experimental details can be found in S. B. Clendenning et al., Adv. Mater. 16, 291 (2004).
-
(2004)
Adv. Mater.
, vol.16
, pp. 291
-
-
Clendenning, S.B.1
-
32
-
-
0343777531
-
-
National Bureau of Standards (US), Circular 539
-
H. E. Swanson, and E. Tatge, Standard X-ray Diffraction Powder Patterns, National Bureau of Standards (US), 1955, Circular 539, p. 4.
-
(1955)
Standard X-ray Diffraction Powder Patterns
, pp. 4
-
-
Swanson, H.E.1
Tatge, E.2
-
36
-
-
0141731203
-
-
W. Y. Chan, A. Berenbaum, S. B. Clendenning, A. J. Lough, and I. Manners, Organometallics 22, 3796 (2003).
-
(2003)
Organometallics
, vol.22
, pp. 3796
-
-
Chan, W.Y.1
Berenbaum, A.2
Clendenning, S.B.3
Lough, A.J.4
Manners, I.5
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