메뉴 건너뛰기




Volumn 109, Issue 2, 2005, Pages 825-832

Nanoscale measurements of conducting domains and current-voltage characteristics of chemically deposited polyaniline films

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; THIN FILMS;

EID: 13244251339     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp046259b     Document Type: Article
Times cited : (70)

References (45)
  • 32
    • 13244295330 scopus 로고    scopus 로고
    • The nanoscale-conducting islands of polyaniline film observed directly from atomic force microscopy-current imaging tunneling spectroscopy
    • (submitted for publication)
    • Wu, C.-G.; Chen, P.-Y.; Chang, S.-S. The nanoscale-conducting islands of polyaniline film observed directly from Atomic Force Microscopy-Current Imaging Tunneling Spectroscopy. Polymer (submitted for publication).
    • Polymer
    • Wu, C.-G.1    Chen, P.-Y.2    Chang, S.-S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.