First AFM observation of thin cermet films close to the percolation threshold using a conducting tip

Physica B: Condensed Matter

Volumn 279, Issue 1-3, 2000, Pages 94-97

  Gadenne, M ^a   Schneegans, O ^b   Houze F ^b   Chretien P ^c   Desmarest, C ^c   Sztern, J ^c   Gadenne, P ^c  

^a CNRS   (France)

^b UNIV PARIS SUD   (France)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; GOLD; MAGNETIC FILMS; MAGNETIC PROPERTIES; NICKEL; PERCOLATION (SOLID STATE); THIN FILMS;

NANOGRAINS;

CERMETS;

EID: 0033903613     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00678-X     Document Type: Article

References (2)

1. Houzé F., Meyer R., Schneegans O., Boyer L. Appl. Phys. Lett. 69:1996;1975.
2. O. Schneegans, F. Houzé, R. Meyer, L. Boyer, Proceedings of the 42nd Holm Conference on Electrical Contacts, 1996, p. 205.