Diagnosis of sequence-dependent chips

Proceedings of the IEEE VLSI Test Symposium

Volumn 2002-January, Issue , 2002, Pages 187-192

  Li, J C M ^a   McCluskey, E J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

Books; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Fault detection; Fault diagnosis; Semiconductor device modeling; Timing; Uncertainty

Indexed keywords

CIRCUIT SIMULATION; COMBINATORIAL CIRCUITS; FAILURE ANALYSIS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES; TIMING CIRCUITS; UNCERTAINTY ANALYSIS; VLSI CIRCUITS;

BOOKS; CIRCUIT FAULTS; CIRCUIT TESTING; TIMING; UNCERTAINTY;

FAULT DETECTION;

EID: 84948417131     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2002.1011137     Document Type: Conference Paper

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