Stability of photodiodes under irradiation with a 157-nm pulsed excimer laser

Applied Optics

Volumn 44, Issue 2, 2005, Pages 197-207

  Shaw, Ping Shine ^a   Gupta, Rajeev ^a   Lykke, Keith R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXCIMER LASERS; IRRADIATION; LASER PULSES; RADIATION DAMAGE; RADIOMETRY; SCHOTTKY BARRIER DIODES; SILICON COMPOUNDS; SYNCHROTRONS; ULTRAVIOLET DETECTORS;

BANDGAP ENERGY; INTERFACE TRAP STATES; PULSED EXCIMER LASERS; THIN LAYERS;

PHOTODIODES;

EID: 12844279881     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.000197     Document Type: Article

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