-
1
-
-
0000402028
-
Quantum efficiency stability of silicon photodiodes
-
R. Korde and J. Geist, "Quantum efficiency stability of silicon photodiodes," Appl. Opt. 28, 5284-5290 (1987).
-
(1987)
Appl. Opt.
, vol.28
, pp. 5284-5290
-
-
Korde, R.1
Geist, J.2
-
2
-
-
84975635026
-
Stability and quantum efficiency performance of silicon photodiode detectors in the far ultraviolet
-
L. R. Canneld, J. Kerner, and R. Korde, "Stability and quantum efficiency performance of silicon photodiode detectors in the far ultraviolet," Appl. Opt. 28, 3940-3943 (1989).
-
(1989)
Appl. Opt.
, vol.28
, pp. 3940-3943
-
-
Canneld, L.R.1
Kerner, J.2
Korde, R.3
-
3
-
-
0027809473
-
One gigarad passivating nitrided oxides for 100% internal quantum efficiency silicon photodiodes
-
R. Korde, J. S. Cable, and L. R. Canfield, "One gigarad passivating nitrided oxides for 100% internal quantum efficiency silicon photodiodes," IEEE Trans. Nucl. Sci. 40, 1655-1659 (1993).
-
(1993)
IEEE Trans. Nucl. Sci.
, vol.40
, pp. 1655-1659
-
-
Korde, R.1
Cable, J.S.2
Canfield, L.R.3
-
4
-
-
0030577340
-
PtSi-n-Si Schottky-barrier photodetectors with stable spectral responsivity in the 120-250-nm spectral range
-
K. Solt, H. Melchior, U. Kroth, P. Kuschnerus, V. Persch, H. Rabus, M. Richter, and G. Ulm, "PtSi-n-Si Schottky-barrier photodetectors with stable spectral responsivity in the 120-250-nm spectral range," Appl. Phys. Lett. 69, 3662-3664 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 3662-3664
-
-
Solt, K.1
Melchior, H.2
Kroth, U.3
Kuschnerus, P.4
Persch, V.5
Rabus, H.6
Richter, M.7
Ulm, G.8
-
5
-
-
0030149121
-
Some effects of low-power ultraviolet radiation on silicon photodiodes
-
R. Goebel, R. Köhler, and R. Pello, "Some effects of low-power ultraviolet radiation on silicon photodiodes," Metrologia 32, 515-518 (1995/1996).
-
(1995)
Metrologia
, vol.32
, pp. 515-518
-
-
Goebel, R.1
Köhler, R.2
Pello, R.3
-
6
-
-
0000066043
-
Absolute silicon photodiodes for 160 nm to 254 nm photons
-
L. R. Canfield, R. E. Vest, R. Korde, H. Schmidtke, and R. Desor, "Absolute silicon photodiodes for 160 nm to 254 nm photons," Metrologia 36, 329-334 (1998).
-
(1998)
Metrologia
, vol.36
, pp. 329-334
-
-
Canfield, L.R.1
Vest, R.E.2
Korde, R.3
Schmidtke, H.4
Desor, R.5
-
7
-
-
0001080177
-
Characterization of photodiodes as transfer detector standards in the 120 nm to 600 nm spectral range
-
P. Kuschnerus, H. Rabus, M. Richter, F. Scholze, L. Werner, and G. Ulm, "Characterization of photodiodes as transfer detector standards in the 120 nm to 600 nm spectral range," Metrologia 35, 355-362 (1998).
-
(1998)
Metrologia
, vol.35
, pp. 355-362
-
-
Kuschnerus, P.1
Rabus, H.2
Richter, M.3
Scholze, F.4
Werner, L.5
Ulm, G.6
-
8
-
-
0003276171
-
Ultraviolet stability of silicon photodiodes
-
L. Werner, "Ultraviolet stability of silicon photodiodes," Metrologia 35, 407-411 (1998).
-
(1998)
Metrologia
, vol.35
, pp. 407-411
-
-
Werner, L.1
-
9
-
-
0032621318
-
Ultraviolet radiometry with synchrotron radiation and cryogenic radiometry
-
P. S. Shaw, K. R. Lykke, R. Gupta, T. R. O'Brian, U. Arp, H. H. White, T. B. Lucatorto, J. L. Dehmer, and A. C. Parr, "Ultraviolet radiometry with synchrotron radiation and cryogenic radiometry," Appl. Opt. 38, 18-28 (1999).
-
(1999)
Appl. Opt.
, vol.38
, pp. 18-28
-
-
Shaw, P.S.1
Lykke, K.R.2
Gupta, R.3
O'Brian, T.R.4
Arp, U.5
White, H.H.6
Lucatorto, T.B.7
Dehmer, J.L.8
Parr, A.C.9
-
10
-
-
0033332847
-
Characterization of UV-induced radiation damage in Si-based photodiodes
-
G. R. Carruthers and K. F. Dymond, eds., Proc. SPIE
-
R. Gupta, K. R. Lykke, P. S. Shaw, and J. L. Dehmer, " Characterization of UV-induced radiation damage in Si-based photodiodes," in Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II, G. R. Carruthers and K. F. Dymond, eds., Proc. SPIE 3818, 27-33 (1999).
-
(1999)
Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II
, vol.3818
, pp. 27-33
-
-
Gupta, R.1
Lykke, K.R.2
Shaw, P.S.3
Dehmer, J.L.4
-
11
-
-
0036494251
-
Characterization of UV detectors at SURF III
-
P. S. Shaw, T. C. Larason, R. Gupta, and K. R. Lykke, "Characterization of UV detectors at SURF III," Rev. Sci. Instrum. 73, 1625-1628 (2002).
-
(2002)
Rev. Sci. Instrum.
, vol.73
, pp. 1625-1628
-
-
Shaw, P.S.1
Larason, T.C.2
Gupta, R.3
Lykke, K.R.4
-
12
-
-
0036901766
-
Metrology of pulsed radiation for 157-nm lithography
-
M. Richter, U. Kroth, A. Gottwald, C. Gerth, K. Tiedtke, T. Saito, I. Tassy, and K. Vogler, "Metrology of pulsed radiation for 157-nm lithography," Appl. Opt. 41, 7167-7172 (2002).
-
(2002)
Appl. Opt.
, vol.41
, pp. 7167-7172
-
-
Richter, M.1
Kroth, U.2
Gottwald, A.3
Gerth, C.4
Tiedtke, K.5
Saito, T.6
Tassy, I.7
Vogler, K.8
-
13
-
-
0037226192
-
Present status of radiometric quality silicon photo-diodes
-
R. Korde, C. Prince, D. Cunningham, R. E. Vest, and E. Gullikson, "Present status of radiometric quality silicon photo-diodes," Metrologia 40, S145-S149 (2003).
-
(2003)
Metrologia
, vol.40
-
-
Korde, R.1
Prince, C.2
Cunningham, D.3
Vest, R.E.4
Gullikson, E.5
-
14
-
-
0141890657
-
Irradiation stability of silicon photodiodes for extreme-ultraviolet radiation
-
F. Scholze, R. Klein, and T. Bock, "Irradiation stability of silicon photodiodes for extreme-ultraviolet radiation," Appl. Opt. 42, 5621-5626 (2003).
-
(2003)
Appl. Opt.
, vol.42
, pp. 5621-5626
-
-
Scholze, F.1
Klein, R.2
Bock, T.3
-
15
-
-
2342548607
-
Interpolation of the spectral responsivity of silicon photodetectors in the near ultraviolet
-
T. Kübarsepp, P. Kärhä, and E. Ikonen, "Interpolation of the spectral responsivity of silicon photodetectors in the near ultraviolet," Appl. Opt. 39, 9-15 (2000).
-
(2000)
Appl. Opt.
, vol.39
, pp. 9-15
-
-
Kübarsepp, T.1
Kärhä, P.2
Ikonen, E.3
-
17
-
-
12844285538
-
Spectral quantum efficiencies of semiconductor photodiodes in the far ultraviolet region
-
T. Saito, K. Katori, M. Nishi, and H. Onuki, "Spectral quantum efficiencies of semiconductor photodiodes in the far ultraviolet region," Rev. Sci. Instrum. 60, 2303-2306 (1989).
-
(1989)
Rev. Sci. Instrum.
, vol.60
, pp. 2303-2306
-
-
Saito, T.1
Katori, K.2
Nishi, M.3
Onuki, H.4
-
18
-
-
0035335965
-
The new ultraviolet spectral responsivity scale based on cryogenic radiometry at Synchrotron Ultraviolet Radiation Facility III
-
P. S. Shaw, T. C. Larason, R. Gupta, S. W. Brown, R. E. Vest, and K. R. Lykke, "The new ultraviolet spectral responsivity scale based on cryogenic radiometry at Synchrotron Ultraviolet Radiation Facility III," Rev. Sci. Instrum. 72, 2242-2247 (2001).
-
(2001)
Rev. Sci. Instrum.
, vol.72
, pp. 2242-2247
-
-
Shaw, P.S.1
Larason, T.C.2
Gupta, R.3
Brown, S.W.4
Vest, R.E.5
Lykke, K.R.6
-
19
-
-
84893994164
-
-
note
-
Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
-
-
-
-
21
-
-
84930881640
-
Effects of ionizing radiation on oxidized silicon surfaces and planar devices
-
E. H. Snow, A. S. Grove, and D. J. Fitzgerald, "Effects of ionizing radiation on oxidized silicon surfaces and planar devices," Proc. IEEE 55, 1168-1185 (1967).
-
(1967)
Proc. IEEE
, vol.55
, pp. 1168-1185
-
-
Snow, E.H.1
Grove, A.S.2
Fitzgerald, D.J.3
-
22
-
-
0014616334
-
Radiation-induced perturbation of the electrical properties of the silicon-silicon dioxide interface
-
H. L. Hughes, "Radiation-induced perturbation of the electrical properties of the silicon-silicon dioxide interface," IEEE Trans. Nucl. Sci. NS-16, 195-202 (1969).
-
(1969)
IEEE Trans. Nucl. Sci.
, vol.NS-16
, pp. 195-202
-
-
Hughes, H.L.1
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