메뉴 건너뛰기




Volumn 39, Issue 1, 2000, Pages 9-15

Interpolation of the spectral responsivity of silicon photodetectors in the near ultraviolet

Author keywords

[No Author keywords available]

Indexed keywords


EID: 2342548607     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.000009     Document Type: Article
Times cited : (27)

References (25)
  • 1
    • 0000118290 scopus 로고    scopus 로고
    • Realization of a scale of absolute spectral response using the National Institute of Standards and Technology high-accuracy cryogenic radiometer
    • T. R. Gentile, J. M. Houston, and C. L. Cromer, “Realization of a scale of absolute spectral response using the National Institute of Standards and Technology high-accuracy cryogenic radiometer,” Appl. Opt. 35, 4392-4403 (1996).
    • (1996) Appl. Opt. , vol.35 , pp. 4392-4403
    • Gentile, T.R.1    Houston, J.M.2    Cromer, C.L.3
  • 2
  • 3
    • 0030148826 scopus 로고
    • Extension of a silicon-based detector spectral-responsivity scale into the ultraviolet
    • 96
    • A. Bittar, “Extension of a silicon-based detector spectral-responsivity scale into the ultraviolet,” Metrologia 32,497-500 (1995/96).
    • (1995) Metrologia , vol.32 , pp. 497-500
    • Bittar, A.1
  • 4
    • 0042385781 scopus 로고
    • A physical basis for the extrapolation of silicon photodiode quantum efficiency into the ultraviolet
    • N. M. Durant and N. P. Fox, “A physical basis for the extrapolation of silicon photodiode quantum efficiency into the ultraviolet,” Metrologia 30, 345-350 (1993).
    • (1993) Metrologia , vol.30 , pp. 345-350
    • Durant, N.M.1    Fox, N.P.2
  • 5
    • 0012674548 scopus 로고
    • New calculations of the quantum yield of silicon in the near ultraviolet
    • J. Geist and C. S. Wang, “New calculations of the quantum yield of silicon in the near ultraviolet,” Phys. Rev. B 27, 48414847 (1983).
    • (1983) Phys. Rev. B , pp. 27
    • Geist, J.1    Wang, C.S.2
  • 6
    • 35949009958 scopus 로고
    • Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects
    • M. V. Fischetti and S. E. Laux, “Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects,” Phys. Rev. B 38, 9721-9745 (1988).
    • (1988) Phys. Rev. B , vol.38 , pp. 9721-9745
    • Fischetti, M.V.1    Laux, S.E.2
  • 7
    • 0000513282 scopus 로고
    • Scattering by ionization and phonon emission in semiconductors
    • R. C. Alig, S. Bloom, and C. W. Struck, “Scattering by ionization and phonon emission in semiconductors,” Phys. Rev. B 22, 5565-5581 (1980).
    • (1980) Phys. Rev. B , vol.22 , pp. 5565-5581
    • Alig, R.C.1    Bloom, S.2    Struck, C.W.3
  • 8
    • 0030149121 scopus 로고
    • Some effects of low-power ultraviolet radiation on silicon photodiodes
    • 96
    • R. Goebel, R. Köhler, and R. Pello, “Some effects of low-power ultraviolet radiation on silicon photodiodes,” Metrologia 32, 515-518 (1995/96).
    • (1995) Metrologia , vol.32 , pp. 515-518
    • Goebel, R.1    Köhler, R.2    Pello, R.3
  • 9
    • 0000402028 scopus 로고
    • Quantum efficiency stability of silicon photodiodes
    • R. Korde and J. Geist, “Quantum efficiency stability of silicon photodiodes,” Appl. Opt. 26, 5284-5290 (1987).
    • (1987) Appl. Opt. , vol.26 , pp. 5284-5290
    • Korde, R.1    Geist, J.2
  • 12
    • 0000471739 scopus 로고    scopus 로고
    • Spectral reflectance of silicon photodiodes
    • A. Haapalinna, P. Karha, and E. Ikonen, “Spectral reflectance of silicon photodiodes,” Appl. Opt. 37, 729-732 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 729-732
    • Haapalinna, A.1    Karha, P.2    Ikonen, E.3
  • 13
    • 0000416414 scopus 로고
    • Interspecimen comparison of the refractive index of fused silica
    • I. H. Malitson, “Interspecimen comparison of the refractive index of fused silica,” J. Opt. Soc. Am. 55, 1205-1209 (1965).
    • (1965) J. Opt. Soc. Am. , vol.55 , pp. 1205-1209
    • Malitson, I.H.1
  • 14
    • 0026461497 scopus 로고
    • Optical functions of silicon determined by two-channel polarization modulation ellipsometry
    • G. E. Jellison, Jr., “Optical functions of silicon determined by two-channel polarization modulation ellipsometry,” Opt. Mater. 1, 41-47 (1992).
    • (1992) Opt. Mater , vol.1 , pp. 41-47
    • Jellison, G.E.1
  • 15
    • 0000745448 scopus 로고    scopus 로고
    • Development of a detector-based absolute spectral irradiance scale in the 380-900-nm spectral range
    • P. Karha, P. Toivanen, F. Manoochehri, and E. Ikonen, “Development of a detector-based absolute spectral irradiance scale in the 380-900-nm spectral range,” Appl. Opt. 36, 89098918 (1997).
    • (1997) Appl. Opt. , pp. 36
    • Karha, P.1    Toivanen, P.2    Manoochehri, F.3    Ikonen, E.4
  • 16
    • 0031141421 scopus 로고    scopus 로고
    • Characterization of a polarization-independent transmission trap detector
    • T. Kubarsepp, P. Karha, and E. Ikonen, “Characterization of a polarization-independent transmission trap detector,” Appl. Opt. 36, 2807-2812 (1997).
    • (1997) Appl. Opt. , vol.36 , pp. 2807-2812
    • Kubarsepp, T.1    Karha, P.2    Ikonen, E.3
  • 17
    • 0000136864 scopus 로고
    • of Solar Cells Series, R. K. Willardson, ed. (Academic Press, New York
    • H. J. Hovel, Semiconductors and Semimetals, Vol. 11 of Solar Cells Series, R. K. Willardson, ed. (Academic Press, New York, 1975), pp. 17-20.
    • (1975) Semiconductors and Semimetals , vol.11 , pp. 17-20
    • Hovel, H.J.1
  • 20
    • 0026224347 scopus 로고
    • Trap detectors and their properties
    • N. P. Fox, “Trap detectors and their properties,” Metrologia 28, 197-202 (1991).
    • (1991) Metrologia , vol.28 , pp. 197-202
    • Fox, N.P.1
  • 21
    • 0026190236 scopus 로고
    • Numerical modeling of silicon photodiodes for high-accuracy applications. Part I. Simulation programs
    • J. Geist, D. Chandler-Horowitz, A. M. Robinson, and C. R. James, “Numerical modeling of silicon photodiodes for high-accuracy applications. Part I. Simulation programs,” J. Res. Natl. Inst. Stand. Technol. 96, 463-469 (1991).
    • (1991) J. Res. Natl. Inst. Stand. Technol. , vol.96 , pp. 463-469
    • Geist, J.1    Chandler-Horowitz, D.2    Robinson, A.M.3    James, C.R.4
  • 22
    • 36149036258 scopus 로고
    • Characterization of photodiodes in the UV and visible spectral region based on cryogenic radiometry
    • F. Lei and J. Fischer, “Characterization of photodiodes in the UV and visible spectral region based on cryogenic radiometry,” Metrologia 30, 297-303 (1993).
    • (1993) Metrologia , vol.30 , pp. 297-303
    • Lei, F.1    Fischer, J.2
  • 23
    • 36749119966 scopus 로고
    • Ultraviolet bleaching and regeneration of -Si = Si3 centers at the Si/SiO2 interface of thinly oxidized silicon wafers
    • 2 interface of thinly oxidized silicon wafers,” J. Appl. Phys. 53, 541-545 (1982).
    • (1982) J. Appl. Phys. , vol.53 , pp. 541-545
    • Caplan, P.J.1    Poindexter, E.H.2    Morrison, R.3
  • 25
    • 0003276171 scopus 로고    scopus 로고
    • Ultraviolet stability of silicon photodiodes
    • L. Werner, “Ultraviolet stability of silicon photodiodes,” Metrologia 35, 407-411 (1998).
    • (1998) Metrologia , vol.35 , pp. 407-411
    • Werner, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.