Absolute silicon photodiodes for 160 nm to 254 nm photons

Metrologia

Volumn 35, Issue 4, 1998, Pages 329-334

  Canfield, L R ^a   Vest, R E ^a   Korde, R ^b   Schmidtke, H ^c   Desor, R ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b International Radiation Detectors   (United States)

^c Lambda Physik GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000066043     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/4/19     Document Type: Article

References (15)

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