Present status of radiometric quality silicon photodiodes

Metrologia

Volumn 40, Issue 1 SPEC., 2003, Pages

  Korde, R ^a   Prince, C ^a   Cunningham, D ^b   Vest, R E ^c   Gullikson, E ^d  

^a International Radiation Detectors   (United States)

^b EASTMAN KODAK COMPANY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; EXCIMER LASERS; HETEROJUNCTIONS; PHOTOCURRENTS; PHOTONS; QUANTUM EFFICIENCY; RADIOMETRY; SEMICONDUCTING SILICON; SYNCHROTRONS;

METAL-SILICIDE FRONT WINDOW; SILICON PHOTODIODES;

PHOTODIODES;

EID: 0037226192     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/1/003     Document Type: Article

References (10)

1. Shaw P, Larason T C, Gupta R, Brown S W, Vest R E and Lyyke K 2001 Rev. Sci. Instrum. 72 2242-7
2. Larason T C and Bruce S S 1998 Metrologia 35 491-6
3. Canfield L R, Vest R E, Korde R, Schmidtke H and Desor R 1998 Metrologia 35 329-34
4. Korde R, Cable J and Canfield R 1993 IEEE Trans. Nucl. Sci. 40 1655-9
5. Korde R and Geist J 1987 Appl. Opt. 26 5284-90
6. Frehlich R 1992 Appl. Opt. 31 5926-9
7. Edward S Yang 1988 Microelectronic Devices (New York: McGraw-Hill) p 360
8. Chaffin R J and Osbourn G C 1980 Appl. Phys. Lett. 37 637-9
9. Schaefer A R, Zalewski E F and Geist J 1983 Appl. Opt. 22 1232-5
10. Stuik R and Bijkerk F 2002 Nucl. Instrum. Methods A 489 370-8