Characterization of UV detectors at SURF III (invited)

Review of Scientific Instruments

Volumn 73, Issue 3 II, 2002, Pages 1625-

  Shaw, Ping Shine ^a   Larason, Thomas C ^a   Gupta, Rajeev ^a   Lykke, Keith R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

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EID: 0036494251     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1445825     Document Type: Conference Paper

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