Ultraviolet stability of silicon photodiodes

Metrologia

Volumn 35, Issue 4, 1998, Pages 407-411

  Werner, L ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003276171     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/4/32     Document Type: Article

References (6)

1. Lei Fu, Fischer J., Metrologia, 1993, 30, 297-303.
2. Goebel R., Köhler R., Pello R., Metrologia, 1995/96, 32, 515-518.
3. Durant N. M., Fox N. P., Metrologia, 1995/96, 32, 505-508.
4. Werner L., Fischer J., Metrologia, 1998, 35, 403-406.
5. Kuschnerus P., Rabus H., Richter M., Scholze F., Werner L., Ulm G., Metrologia, 1998, 35, 355-362.
6. Korde R., Cable J. S., Canfield L.R., IEEE Trans. Nucl. Sci., 1993, 40, 1655-1659.