Characterization of UV-induced radiation damage to Si-based photodiodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3818, Issue , 1999, Pages 27-33

  Gupta, Rajeev ^a   Lykke, Keith R ^a   Shaw, Ping Shine ^a   Dehmer, Joseph L ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL VARIABLES MEASUREMENT; PERFORMANCE; QUANTUM EFFICIENCY; RADIATION DAMAGE; RADIOMETERS; REFLECTION; SEMICONDUCTING SILICON; SYNCHROTRON RADIATION; ULTRAVIOLET DETECTORS; ULTRAVIOLET RADIATION;

ABSOLUTE SPECTRAL RESPONSIVITIES; CRYOGENIC RADIOMETER; SILICON PHOTODIODES;

PHOTODIODES;

EID: 0033332847     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)