Conductive atomic force microscope nanopatterning of hydrogen-passivated silicon in inert organic solvents

Nano Letters

Volumn 5, Issue 1, 2005, Pages 91-95

  Kinser, C Reagan ^a   Schmitz, Matthew J ^a   Hersam, Mark C ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEOXYGENATION; FIELD INDUCED OXIDATION; MECHANICAL SCRIBING; NANOSCALE FEATURES;

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; ELECTRIC CONDUCTANCE; HYDROPHOBICITY; ORGANIC SOLVENTS; OXIDATION; PASSIVATION;

NANOSTRUCTURED MATERIALS;

EID: 12844250030     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl048275q     Document Type: Article

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